IC Testing Experience Introduction-EEWORLD

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(I) Commonly used detection methods Commonly used detection methods for integrated circuits include online measurement method, non-online measurement method and substitution method. 1. Non-online measurement Non-online measurement When the integrated circuit is not soldered into the circuit, the DC resistance value between its pins is measured and compared with the DC resistance value between the pins of the known normal integrated circuit of the same model to determine whether it is normal. 2. Online measurement The online measurement method uses voltage measurement method, resistance measurement method and current measurement method to measure the voltage value, resistance value and current value of each pin of the integrated circuit on the circuit to determine whether the integrated circuit is damaged. 3. Substitution method The substitution method is to replace the tested integrated circuit with a known intact integrated circuit of the same model and specification to determine whether the integrated circuit is damaged. (II) Detection of commonly used integrated circuits 1. Detection of microprocessor integrated circuits The key test pins of microprocessor integrated circuits are VDD power supply terminal, RESET reset terminal, XIN crystal oscillator signal input terminal, XOUT crystal oscillator signal output terminal and other line input and output terminals. Measure the resistance and voltage of these key pins to the ground on the circuit to see if they are the same as the normal values (which can be found in the product circuit diagram or related maintenance information). The RESET reset voltage of different models of microprocessors is also different. Some are low-level resets, that is, they are low at the moment of power on and maintain a high level after reset; some are high-level resets, that is, they are high at the moment of switching and maintain a low level after reset. 2. Detection of switching power supply integrated circuits The key pin voltages of switching power supply integrated circuits are the power supply terminal (VCC), the excitation pulse output terminal, the voltage detection input terminal, and the current detection input terminal. Measure the voltage and resistance values of each pin to the ground. If they are significantly different from the normal values, and the peripheral components are normal, it can be determined that the integrated circuit is damaged. For thick-film integrated circuits with built-in high-power switching tubes, the forward and reverse resistance values between the C, B, and E poles of the switching tube can also be measured to determine whether the switching tube is normal. 3. Detection of audio power amplifier integrated circuits When checking audio power amplifier integrated circuits, the voltage and resistance values of the power supply terminals (positive power supply terminal and negative power supply terminal), audio input terminal, audio output terminal and feedback terminal to ground should be detected first. If the data values of each pin are significantly different from the normal values, and the peripheral components are normal, the integrated circuit is damaged internally. For audio power amplifier integrated circuits that cause silent faults, when the power supply voltage is measured normally, the signal interference method can be used to check. When measuring, the multimeter should be set to R×1, the red test lead should be grounded, and the black test lead should be used to touch the audio input terminal. Under normal circumstances, there should be a strong "click" sound in the speaker. 4. Detection of operational amplifier integrated circuits Use the DC voltage range of the multimeter to measure the voltage value between the output terminal of the operational amplifier and the negative power supply terminal (the voltage value is higher when static). Use hand-held metal tweezers to touch the two input terminals of the operational amplifier in turn (add interference signals). If the multimeter needle swings significantly, it means that the operational amplifier is intact; if the multimeter needle does not move, it means that the operational amplifier is damaged. 5. Detection of time-base integrated circuits The time-base integrated circuit contains digital circuits and analog circuits, and it is difficult to directly test its quality with a multimeter. The test circuit shown in Figure 9-13 can be used to detect the quality of the time-base integrated circuit. The test circuit consists of resistors and capacitors, light-emitting diodes LED, 6V DC power supply, power switch S and 8-pin IC socket. After inserting the time-base integrated circuit (such as NE555) into the IC socket, press the power switch S. If the time-base integrated circuit under test is normal, the light-emitting diode LED will flash; if the LED is not lit or is always on, it means that the performance of the time-base integrated circuit under test is poor.

Keywords：IC Detection Reference address：IC Testing Experience Introduction

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