High-speed serial testing-Test Measurement-EEWORLD

PCI Express Transmitter Compliance/Debug Solution

The PCI-SIG 6.0 specification introduced PAM4 signaling, designed to enable 64GTs while maintaining backward compatibility with NRZ signaling. The multi-level (PAM4) approach brings new signal integrity to adopters and verification teams ...

Keywords： PCI Express Transmitter Tektronix

Publish Time：2024-09-05

[When building a signal chain, you need to know the high-speed signal knowledge (Part 3)]

The challenge of high speed – loss and balance of transmission link Author: Yu Yang, AE Manager of Tektronix China The contradiction of high-speed bus upgrade is that consumers’ demand for performance drives the signal speed. ...

Keywords： Signal Chain High Speed Signal Tektronix

Publish Time：2024-04-08

To build a signal chain, you need to know the high-speed signal knowledge (1)

Why use LVDS or JESD204B standards? The signal chain is the bridge between the real world and the digital world. With the improvement of ADC sampling rate and sampling accuracy, the signal transmission speed of interface chips is also getting faster and faster. ...

Keywords： Signal chain high-speed signal LVDS JESD standards Tektronix Technology

Publish Time：2024-03-08

[Tektronix TMT4 Practical Sharing] How to test and verify PCIe links with Redriver more efficiently and accurately?

Redriver is a common electronic device used to enhance the amplitude and quality of signals in high-speed digital signal transmission to extend the transmission distance and improve signal reliability. ...

Keywords： Tektronix test PCIe link

Publish Time：2023-08-21

[Tektronix TMT4 Practical Sharing] How to efficiently complete PCIe board material screening and interoperability debugging?

In recent years, the global chip shortage has prompted companies to think about strengthening the resilience of their supply chains. Companies no longer blindly pursue single-source procurement with the highest cost-effectiveness but also the greatest risk, but instead actively ...

Keywords： Tektronix PCIe card debugging

Publish Time：2023-08-15

Focusing on in-vehicle high-speed serial buses, analyzing Tektronix GMSL/FPD-LINK test solutions

GMSL is Maxim's automotive SERDES bus, which is used for high-performance cameras and high-definition video connections. It can be transmitted on both coaxial and shielded twisted pair cables. For automotive ADAS camera applications, it is necessary to consider ...

Keywords： In-vehicle high-speed serial bus bus Tektronix GMSL FPD-LINK test

Publish Time：2023-08-04

Tektronix Launches Breakthrough TMT4 Test Solution, New Approach to Accelerate PCIe 3/4 Test

Tektronix Launches Breakthrough TMT4 Test Solution, New Approach to Accelerate PCIe 3 4 Test Beijing, China, October 27, 2022 - Tektronix Technology has launched a new product category that subverts PCI ...

Keywords： Tektronix TMT4 PCIe

Publish Time：2022-10-27

Hot topics continue, the high-speed interface testing forum has reached the 14th and 15th sessions

Beijing, China, July 25, 2022—As network architectures change and latency requirements increase, data processing requirements for heterogeneous computing are also evolving. From the initial CPU to the increasingly ...

Keywords： Hot topics continue the high-speed interface testing forum has reached the 14th and 15th sessions

Publish Time：2022-07-25

Spectrum Instruments Expands Industry Leadership with Breakthrough Digitizer

Beijing, China, May 18, 2022 - Spectrum Instruments of Germany has announced the launch of the world's first digitizers for massive data streams. The series uses a 16-lane PCIe interface (G ...

Keywords： Spectrum Instrument Digitizer

Publish Time：2022-05-18

Tektronix Delivers Industry-First PCIe 6.0 Test Solution

New solution accelerates customer transition to PCIe 6.0 PAM4 signaling to meet growing performance demands Beijing, China, February 21, 2022 – The PCI-SIG Working Group released the PCIe ...

Keywords： Tektronix PCIe test

Publish Time：2022-02-21

Anritsu, Tektronix, and GRL Join Forces to Host High-Speed Interface Test Forum 2021 Annual Meeting

Working hand in hand with industry leaders, the three companies will continue to jointly hold the High-Speed Interface Test Forum 2021 Annual Meeting. Standing at the peak of the industry, we will review and look forward together and work hard on cutting-edge hot spots. Beijing, China, January 24, 2022 – ...

Keywords： High-speed interface test forum Anritsu Tektronix GRL

Publish Time：2022-01-24

DDR5 Signal Integrity Basics

Author: Tim Wang Lee, Keysight Technologies In July 2020, the new DDR 5 standard was born. The exciting DDR5 technology guarantees higher data rates and lower power consumption. This is an interface designer ...

Keywords： DDR5

Publish Time：2021-01-20

32 Gbps High-Speed SerDes Mass Production Test Solution

Author: Cao Xurong, Fang Yanfen, Wang Yeqing (Advantest (China) Management Co., Ltd.) Abstract: With the continuous improvement of SerDes chip integration, complexity, and transmission rate, traditional automation...

Keywords： SerDes 93000 32Gbps

Publish Time：2017-04-06

LIN, CAN and FlexRay Serial Bus Debugging with Oscilloscopes

For long-distance serial communication and control between various automotive subsystems (such as comfort control systems, immobilizers, transmission and engine controls), CAN, LIN and FlexRay protocols are the most common serial bus applications in the automotive industry today. ...

Keywords： Oscilloscope LIN CAN FlexRay

Publish Time：2014-06-03

Principle and implementation of common test pattern generator for serial bus

This article discusses the principle of pseudo-random code streams, a common test pattern used in high-speed serial links, and the impact of different test patterns on physical layer test results. Common test patterns for high-speed serial buses In today's telecommunications and computer products, there are more and more serial buses in circuits, and the speed is getting faster and faster than traditional parallel buses......

Keywords： Serial bus common test code generator

Publish Time：2012-09-22

Crosstalk Measurement Techniques for Multi-channel and Multi-rate High-speed Serial Communication Systems

　　Due to some drawbacks of parallel systems at high operating frequencies (such as skew, timing budget, and layout limitations), many systems have turned to serial interfaces to transmit information. These serial interfaces can be designed to support multiple standards (such as SD-SDI and HD-SDI in digital video broadcast systems, USB and......

Keywords： Multi-channel communication system multi-rate crosstalk measurement technology

Publish Time：2012-09-01

Agilent's complete solution for high-speed serial testing

As people's demand for information continues to increase, high-speed serial transmission is increasingly favored by the market due to its high transmission characteristics. Various high-speed serial transmission standards emerge in an endless stream, and the transmission rate of the serial bus has reached or even exceeded 5Gbit/s. However, behind the increase in transmission rate comes the difficulty of designing the transmission path......

Keywords： Agilent High-Speed Serial Test PCIe

Publish Time：2012-08-31

Simplifying High-Speed Serial Data Debug Validation and Compliance Testing Q&A

1. Hello, expert: What is the main application area of DPOJET? The main application area of DPOJET is high-speed serial bus development, debugging and consistency testing, such as: PCI_E/DDR/HDMI/DISPLAYPORT/SATA and other high-speed serial buses. 2. I would like to ask Senior Engineer Zhang Xin: What does the so-called high speed mean? Combined with Tektronix display......

Keywords： High-speed serial data debugging verification consistency testing

Publish Time：2012-08-16

Innovative serial bus test method that can handle data rates above 6.4Gbps

Semiconductor devices used in high-end computing (advanced microprocessors) and consumer electronics (graphics and gaming chipsets) devices generally provide data rates up to 6.4Gbps through high-speed serial bus interfaces, such as PCI Express and HyperTransport. According to the 2005 International Roadmap for Semiconductors (ITRS), by 2020, the number of ......

Keywords： Data rate serial bus test high speed bus

Publish Time：2012-07-04

Serial Data System Jitter Basics

[Abstract] This article briefly introduces the relevant foundations of general serial data systems, the basic definition of jitter, TIE jitter, the concept of bit error rate, etc., laying the foundation for further analysis and understanding of serial data jitter....

Keywords： Serial data system jitter trigger

Publish Time：2012-04-12