Article count:858 Read by:1113778

Account Entry

NI Chip Verification and Electronic Measurement Technology Summit, a sneak peek at highlights

Latest update time:2021-09-16
    Reads:

A chip needs to be tested at every stage from design to tape-out to mass production. Verification and testing run through the entire process, which can be regarded as a responsibility, but the cumbersome and high cost of testing methods often discourage people.


At the upcoming NI Chip Verification and Electronic Measurement Technology Summit 2021 , we invite industry experts to discuss the pain points and solutions of chip verification. You will learn how to shorten measurement cycles to adapt to changing requirements, synchronize multi-instrument measurement programs, reuse measurement IP, and quickly access and interpret product data throughout the product lifecycle.


Let’s take a look at some spoilers first.



⏰ Time: October 21 (Thursday), 13:00–17:30


Latest articles about

 
EEWorld WeChat Subscription

 
EEWorld WeChat Service Number

 
AutoDevelopers

About Us Customer Service Contact Information Datasheet Sitemap LatestNews

Room 1530, Zhongguancun MOOC Times Building,Block B, 18 Zhongguancun Street, Haidian District,Beijing, China Tel:(010)82350740 Postcode:100190

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号