China's first quantum chip non-destructive probe electrical measurement platform put into use in Anhui

A reporter recently learned from the Anhui Quantum Computing Engineering Research Center that the country's first non-destructive probe electrical measurement platform dedicated to quantum chip production has been put into use on China's first quantum chip production line, giving quantum chip production a "keen eye".

It is understood that the non-destructive probe electrical measurement platform was independently developed by Hefei Benyuan Quantum Computing Technology Co., Ltd. The minimum measurement range is reduced to the micron level. The minimum diameter of the thin film scar caused by the probe is less than 1 micron. The measurement process does not affect the coherence performance of the superconducting quantum bit. It has the advantages of high stability and high motion accuracy.

"The non-destructive probe station plays an important role in the production of quantum chips. It is like Sun Wukong's 'fire eyes and golden pupils', which can quickly and accurately identify which quantum bits on the quantum chip are qualified and which are unqualified." Jia Zhilong, deputy director of the Anhui Quantum Computing Engineering Research Center, introduced that this instrument is a necessary tool for the production of quantum chips, which can shorten the research and development cycle of quantum chips and further improve the yield rate of quantum chips.