Tektronix oscilloscope current measurement MDO4054C

Publisher:BlossomSunriseLatest update time:2022-04-25 Source: eefocusKeywords:Tektronix Reading articles on mobile phones Scan QR code
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With long record lengths, a single acquisition can include thousands of screens of waveform data. As the industry's best navigation and search tool, Wave Inspector can help you find events of interest in seconds.


Zoom and scroll

This dedicated, two-tier front panel control provides intuitive control for zooming and panning. The inner control adjusts the zoom factor (or zoom ratio), with clockwise rotation activating zoom and gradually increasing the zoom factor, and counterclockwise rotation decreasing the zoom factor and eventually turning zoom off. No more navigating through several menus to zoom the display. The outer control pans the zoom box across the waveform to quickly get to the portion of the waveform you're interested in, and also uses force feedback to determine how fast to pan across the waveform. The faster you turn the outer control, the faster the zoom box moves. To change the direction of panning, simply turn it in the opposite direction.


User Tags

You can place one or more marks on the waveform by pressing the Set Mark button on the front panel. To navigate between these marks, simply press the Previous (←) and Next (→) buttons on the front panel.


Search Tags

The Search button allows an automated search through long acquisitions for user-defined events. All occurrences of the event are highlighted with search marks and can be easily navigated to using the Previous (←) and Next (→) buttons on the front panel. Search types include edge, pulse width/glitch, timeout, runt, logic, setup and hold, rise/fall time, parallel bus and I2C, SPI, RS-232/422/485/UART, USB 2.0, Ethernet, CAN, CAN FD, LIN, FlexRay, MIL-STD-1553, ARINC-429, and I2S/LJ/RJ/TDM packet content. The Search Marks Table provides a tabular representation of the events found during the automated search. Each event is displayed with a time stamp to allow easy inter-event timing measurements.


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