Device Selection Seminar Promotes "Made in China" High-Performance Test Instruments

The 2013 First Instrument and Component Selection Technology Seminar is about to open

　　Test instruments, as the most important tool in test technology, have always been a seemingly small but far-reaching market. According to statistics, although the market for test instruments only accounts for 0.02% of the global economy each year, it drives more than 70% of global economic growth. For China's industrial structure, electronic test instruments have always been a relatively backward link in the electronics industry. The lag of the instrument industry has indirectly delayed the rapid development of my country's electronics industry.

　　Every electronic design engineer's work is inseparable from test instruments, and the design and development of high-performance test instruments also originates from the wisdom of a large number of electronic engineers. In the process of developing instruments and meters, R&D personnel inevitably involve the selection of various electronic devices. Test instruments have extremely unique performance and index requirements for semiconductor devices. For this reason, many electronic component manufacturers have also developed various special products for test instruments. How to reasonably select these products and apply them to their own instrument designs, so that design engineers can develop high-performance, easy-to-use, reliable and cost-effective test instruments, is crucial to improving the competitiveness of test instrument products made in China.

　　On November 13, 2013, during the 82nd China Electronics Fair, the China Electronics Fair Organizing Committee and Electronic Products World magazine will jointly hold the " First Instrument and Meter Device Selection Technology Seminar ". We sincerely invite electronic engineers to visit the Shanghai International Exhibition Center and discuss with experts on topics such as "The importance of analog front-end in test instrument design and special selection requirements", "The value of ADC performance to test instrument signal capture and selection guidance", "How to choose the most suitable amplifier and related signal processing system", "FPGA's advantages and application examples in test instrument design", "Test instrument operating system application guide", "Signal analysis and signal processing technology in different test instruments", etc. We will listen to the application skills and related solutions of the latest products of many semiconductor manufacturers in the design of electronic test instruments, exchange engineers' instrument design needs, and jointly find the most targeted design solutions.