StarTech's Pluto integrated reliability test system has started accepting orders and shipping

Star Technology, a leading semiconductor parameter and reliability system manufacturer, announced that its Pluto series per-pin SMU test system has been selected by top semiconductor manufacturers and has begun shipping in the first quarter of 2021 to improve production efficiency and engineering test accuracy, and to carry out order-based manufacturing and shipment. This proves the unique capabilities of this new reliability test system and has attracted attention in the semiconductor test industry.

The Pluto series is a next-generation integrated reliability test system, with functions covering all wafer and package-level reliability requirements, including HCI, BTI, OTF, TDDB, EM, etc. The key test capabilities surpass the reliability test systems of other competing vendors in the market. It has an SMU-per-pin architecture with a measurement time of 1 microsecond, as well as complete HCI, GOI and EM integrated reliability test verification capabilities. These features enable the Pluto series test system to test 480 devices under test in parallel through up to 960 SMU channels, achieving higher test performance and production volume. It not only reduces test costs, but also significantly improves the throughput flexibility of industry customers, especially the next generation of nano-node technology.

In addition to supporting all nanometer processes and device reliability verification, the Pluto series also provides customers with flexible functions, allowing users to develop customized test programming and methods based on their unique needs. It can be connected to the independently controlled micro-oven module used in the device under test (DUT) at the package level or module level, and can also be seamlessly integrated with STAR's multi-site wafer-level probe station to provide per-pin wafer-level verification for technologies below 3 nanometers.

Dr. Junliang Liu, CEO of STAr Technology, said, "After the Pluto series test system was launched in the fourth quarter of 2020, we started taking orders and completing deliveries. It is the next-generation SMU per-pin test system, which has completely changed the previous industry reliability solutions. In the future, STAr will continue to work hard to optimize the test experience and provide customers with high-precision measurement results and high-performance optimal test solutions."

Star Pluto tester supports wafer-level and package-level reliability verification tests