[October 17th | Xi'an] Heavyweight testing technology seminar, learn the latest content of computing chips, NTN, Internet of Vehicles, and radio frequency testing in 4 hours

Topic: 5G Prospects, Enabling 6G: From RedCap to NTN Testing Technology Solution

Introduction: After the freezing of the 5G R17 standard, the industry has brought new technologies and challenges. The development of two very representative technologies, RedCap and NTN, has brought new vitality to the industry, and the development of these new technologies will also empower the future development of 6G. Yes, this topic will comprehensively introduce 5G R17 test technology solutions, focusing on RedCap and NTN protocol updates, industry development and test challenges, and interpretation of the latest test solutions.

Topic: Computing chips and key technologies: Overview of PCIe/CXL and DDR testing

Introduction: The AIGC wave brought by ChatGPT has increasing requirements for computing power. Interconnecting multiple chips or accelerator cards through high-speed buses is an effective way to increase computing power. This topic will discuss the testing technology related to the interconnection and storage of computing power chips. Including PCIe 5.0/6.0, CXL/UCIe, DDR/LPDDR.

Topic: From Static to Dynamic: Comprehensive Assessment of Power Semiconductors

Introduction: Semiconductor components form the basis of modern electronic equipment and systems. Their performance and stability directly affect the performance and reliability of electronic equipment. This topic will focus on static and dynamic testing of power semiconductor parameters.

Topic: Coffee break

Topic: Solving range anxiety: high-power fast charging test solution for new energy vehicles

Speaker: Bi Wenjun, automotive testing technology expert at Keysight Technologies

Topic: Interpretation of key technologies of Internet of Vehicles: C-V2X testing challenges and solutions

Introduction: In the era of intelligent connected cars, cars have become mobile intelligent terminals, and the Internet of Vehicles technology that communicates between cars, roads, people, and other cars has become the key to realizing intelligent connected cars. At present, the Internet of Vehicles technology represented by C-V2X is ushering in a window period for development. This topic will comprehensively introduce the standard evolution, industry development, testing challenges and solutions of Internet of Vehicles technologies such as C-V2X.

Topic: From Wi-Fi 6 to Wi-Fi 7: Interpretation of the new signaling test solution

Introduction: After Wi-Fi 6 and Wi-Fi 6e, the Wi-Fi 7 era is coming. What new changes will the Wi-Fi 7 standard bring, and what testing challenges will it bring? This topic will explain the development of Wi-Fi 7 technical standards, as well as new testing challenges and solutions.

Time: 17:00-17:10

Topics: Q&A, lucky draw

Topic: Welcome speech

Topic: Modern component testing techniques

Introduction: Today's components are getting smaller and smaller and more integrated. Multi-port and high integration have become the development direction. The complexity of the technology is growing exponentially, which also brings many challenges to the corresponding testing.

This topic explains in detail Keysight's solutions and techniques for component testing to improve testing efficiency, testing precision and accuracy.

Topic: A new generation of test platform to calmly cope with the challenges caused by complex signals

Introduction: Keysight has launched a new generation of RF vector signal generator N5186A MXG. Based on DDS architecture and high-performance DAC design, it provides multi-channel, large-bandwidth, high-performance signal generation for wireless communications, radar applications and many other fields, helping the advancement of technology. Innovation. This topic explains in detail the performance and functions of N5186A MXG.

Topic: Phase noise testing technology and new solutions

Introduction: This topic explains in detail the basic principles of phase noise, the importance of phase noise measurement, and the methods and techniques for phase noise measurement. At the same time, the performance of Keysight's new E5055A SSA-X signal source analyzer was tested for phase noise.

Topic: Coffee break

Topic: Calibration and measurement methods for phased array antennas

Introduction: As the integration level of phased array antennas continues to increase and the cost continues to decrease, it is increasingly used in mobile communications and low-orbit satellite communications. Rapid calibration and measurement of phased array antennas is a matter of concern. This topic will introduce the development trend of phased array antennas, the principles and methods of phased array antenna calibration, and phased array antenna calibration and EIRP, G/T, and EVM measurement solutions based on Keysight's PNA-X vector network. .

Topic: Broadband satellite signal modulation quality test

Introduction: Low-orbit communication satellites use larger system bandwidth and more complex signal formats in order to increase system speed. Large bandwidths and complex signal formats also bring greater challenges to testing.

This section will demonstrate Keysight's complete solutions in the above applications, and discuss how to evaluate and analyze the characteristics of communication systems and devices under broadband modulation, as well as the sources of errors.

Topic: Coping with new challenges in the digital revolution of transceiver modules

Introduction: The digital trend of transceiver modules (T/R Modules) is increasingly prominent in application fields such as satellite communications and ground communications. The high degree of integration of radio frequency circuits such as amplifiers and converters with digital parts such as ADC and DAC has brought improvements in size and efficiency, but it has also brought new challenges to testing. The disappearance of analog test ports makes many traditional test solutions no longer applicable, so how should the performance of new digital TR modules be evaluated? Are traditional RF indicators still applicable after digitization? This topic will discuss with you one by one.

Time: 17:00-17:10

Topics: Q&A, lucky draw