Research on a new type of withstand voltage test system
This paper introduces a withstand voltage test system controlled by an industrial PC and in compliance with the IEC61010 standard. The system consists of a programmable power supply, a test circuit, a signal sampling/conditioning circuit, and a data acquisition interface card. Experiments show that the system works stably and has high data repetition accuracy.
Keywords: withstand voltage; test; industrial PC
Beijing 100085, China)
a withstand voltage test (as shown in Figure 1), a high voltage generator generates a set high voltage. By controlling the opening and closing of switch K, a voltage higher than normal operation is applied to the device under test for testing. The applied voltage value is measured by the voltmeter at both ends of the high voltage generator. This voltage must last for a specified period of time. The withstand voltage capacity of the tested device is determined by observing the leakage current value of the ammeter in the loop. If the leakage current of a device or component under test is also kept within the specified range within the specified time, it can be determined that the device under test can operate safely under normal conditions.
Different products have different technical specifications. For general equipment, the withstand voltage test is to test the leakage current value between the live wire and the housing. The basic rule is: take twice the working voltage of the object under test plus 1000V as the standard test voltage. The test voltage of some products may be higher than twice the working voltage plus 1000V. IEC61010 stipulates that within 5s, the test voltage gradually rises to the required test voltage value (such as 5kV, etc.), and then maintains it for a specified time (5s). At the same time, the leakage current value of the circuit is measured to determine whether the withstand voltage test meets the test standard. Then, within the specified time (such as 5s), the test voltage is gradually reduced to zero. [1]?
2.2 Computer interface circuit and control logic, control level interface
The data acquisition circuit uses a self-designed ISA board, including address decoding circuit, bus interface, A/D conversion, analog switch and other parts; it can complete analog input/output and digital input/output.
In the system, the opening and closing of the AC contactor is controlled by the high and low of the digital output signal, including the start, protection and stop of the withstand voltage tester, and the generation of SPWM signals in the power module, the start and blockage of the drive signal and other logical controls are realized through the control of the digital output signal. In addition, the operation of the system is realized by computer programs, and the digital I/O signal logic level of the data acquisition card of the computer bus cannot directly drive the contactor. Therefore, a related control level conversion circuit is designed in the hardware circuit, such as: driving the contactor through the solid-state relay SSR.
2.3 Power supply
The power supply part adopts computer closed-loop control technology. The DC voltage U?2 generated by the AC voltage U?1 (50Hz, 220V) after rectification and filtering varies within the range of (0.9~1.414)[2] times the AC power supply voltage value; the single-phase inverter is realized by the H-bridge composed of IGBT, and the required AC voltage is obtained by controlling the gate trigger pulse sequence of the H-bridge arm of the IGBT. The pulse sequence designed in this system is controlled by SPWM wave, and the computer outputs appropriate digital signals, which form a closed loop through the voltage sampling link to output basically continuously adjustable AC voltage; a first-level filtering link is added on the AC output side to obtain a relatively ideal sine wave. The control of SPWM wave is achieved by controlling the modulation index m (the ratio of the sine wave amplitude to the triangle wave amplitude); changing the amplitude of the sine wave changes the modulation index m (the modulation index m has 256 variable values), thereby achieving the purpose of controlling the test voltage of the withstand voltage tester. The AC voltage U3 output by the inverter is the product of 0.5 times the DC side voltage and the modulation index m[2]. Since the withstand voltage test requires a higher voltage, a first-level step-up transformer link is designed for this purpose. Through the voltage sampling link and the use of computer closed-loop control technology, the set test high voltage U4 is applied to the device under test for testing (Figure 3).
[3]Lin Weixing. Application of 16-bit single-chip microcomputer in voltage withstand tester[J]. Industrial Control Computer, 2002, 15(6).
[4]Lai Shouhong. Microcomputer control technology[M]. Beijing: Machinery Industry Press, 2002.
Further check the timing between 51 and RAM6264. According to the device manual of ATMEL, the write waveform is as follows:
Previous article:Single chip computer temperature measurement and control system using thermocouple converter
Next article:High-speed communication between intelligent instrument and microcomputer based on enhanced parallel port
- Popular Resources
- Popular amplifiers
- High signal-to-noise ratio MEMS microphone drives artificial intelligence interaction
- Advantages of using a differential-to-single-ended RF amplifier in a transmit signal chain design
- ON Semiconductor CEO Appears at Munich Electronica Show and Launches Treo Platform
- ON Semiconductor Launches Industry-Leading Analog and Mixed-Signal Platform
- Analog Devices ADAQ7767-1 μModule DAQ Solution for Rapid Development of Precision Data Acquisition Systems Now Available at Mouser
- Domestic high-precision, high-speed ADC chips are on the rise
- Microcontrollers that combine Hi-Fi, intelligence and USB multi-channel features – ushering in a new era of digital audio
- Using capacitive PGA, Naxin Micro launches high-precision multi-channel 24/16-bit Δ-Σ ADC
- Fully Differential Amplifier Provides High Voltage, Low Noise Signals for Precision Data Acquisition Signal Chain
- Innolux's intelligent steer-by-wire solution makes cars smarter and safer
- 8051 MCU - Parity Check
- How to efficiently balance the sensitivity of tactile sensing interfaces
- What should I do if the servo motor shakes? What causes the servo motor to shake quickly?
- 【Brushless Motor】Analysis of three-phase BLDC motor and sharing of two popular development boards
- Midea Industrial Technology's subsidiaries Clou Electronics and Hekang New Energy jointly appeared at the Munich Battery Energy Storage Exhibition and Solar Energy Exhibition
- Guoxin Sichen | Application of ferroelectric memory PB85RS2MC in power battery management, with a capacity of 2M
- Analysis of common faults of frequency converter
- In a head-on competition with Qualcomm, what kind of cockpit products has Intel come up with?
- Dalian Rongke's all-vanadium liquid flow battery energy storage equipment industrialization project has entered the sprint stage before production
- Allegro MicroSystems Introduces Advanced Magnetic and Inductive Position Sensing Solutions at Electronica 2024
- Car key in the left hand, liveness detection radar in the right hand, UWB is imperative for cars!
- After a decade of rapid development, domestic CIS has entered the market
- Aegis Dagger Battery + Thor EM-i Super Hybrid, Geely New Energy has thrown out two "king bombs"
- A brief discussion on functional safety - fault, error, and failure
- In the smart car 2.0 cycle, these core industry chains are facing major opportunities!
- The United States and Japan are developing new batteries. CATL faces challenges? How should China's new energy battery industry respond?
- Murata launches high-precision 6-axis inertial sensor for automobiles
- Ford patents pre-charge alarm to help save costs and respond to emergencies
- New real-time microcontroller system from Texas Instruments enables smarter processing in automotive and industrial applications
- 【Wireless closed-loop feedback system for desktop robotic arms】
- 8/21-22@Wuhan! Intel/World Peace Group invites you to participate in the Artificial Intelligence Technology Introduction and Implementation Seminar
- Professor Li Xia: How basic should basic research be?
- DSP Flash API Steps
- 【i.MX6ULL】Driver Development 11——LCD Driver Practice
- Microcontroller interview question collection
- HEF4051 is easy to damage
- Microchip Automotive Innovation Series Online Seminar Invites You to Attend!
- [STM32WB55 review]——by damiaa
- 【DIY Creative LED】WS2812 test successful