NI STS system meets semiconductor test challenges with a multi-pronged approach
Semiconductor testing has always been a strategic investment area for NI. With a platform-based approach, NI's semiconductor testing solutions fully meet the series of testing challenges brought about by the increase in chip integration. To be honest, the STS system is NI's forte in the semiconductor field .
At the SEMICON held in Shanghai not long ago, the Talos Laboratory Engineering Handler based on the NI STS solution demonstrated by NI and its partner esmo immediately became the focus of the entire audience. Today, let’s talk about what surprises STS has brought to the semiconductor testing industry and specific usage tutorials.
NI STS system and Reid Ashman manipulator are perfectly matched, making Talos laboratory engineering handler more intelligent
The equipment realizes fully automated production testing and supports three-temperature testing, temperature stability better than +/-0.5 degrees, automatic laser positioning system and other functions. Also because of the use of the unified development environment LabVIEW and test management execution software TestStand, this sorting machine will also be used in laboratory and mass production testing, and reduce data correlation time, further improving semiconductor testing efficiency.
NI STS System Overview
We have prepared a detailed tutorial on how to use the STS system. Click on the underlined text to view the relevant tutorial directly.
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1. STS Test Head
The NI STS is a family of hardware/software products used for semiconductor characterization and production. The NI STS family consists of the STS T1, STS T2, and STS T4. The main differences between the T1, T2, and T4 are their size and the number of 18-slot NI PXI chassis they can accommodate (T1 - one PXI chassis; T2 - two PXI chassis; T4 - four PXI chassis). This section describes the I/O and controls of the T1, T2, and T4. The video in the following article shows the NI STS input and output panels and their integrated functionality within a test cell.
2. STS Operator Interface
This chapter describes the process of running tests on the STS. The OI (Operator Interface) consists of several controls and display boxes that are used to configure the test station, enter batch information, execute tests, and view yield, binning information, and test results.
3. Tester Admins
This chapter provides a reference guide for creating a bootable USB drive and the process of loading an STS controller image using Acronis Image tools. Since OI is a highly customized operator interface for clients, we also describe how to modify the factory default STS operator interface and meet the specific needs of the customer.
4. Handlers and Probers
The STS can be soft docked or hard docked to the sorter and probe test station. Each type of STS consists of a standard communication interface and a docking interface. NI has docked with almost all common handlers and probers found in most factories. The video in the following article introduces the configuration process of the sorter and probe test station driver and describes how to configure the simulated sorter in the operator interface.
5. Tester Maintenance
This chapter, Tester Maintenance, describes general maintenance and basic operations of the NI STS system. NI STS Maintenance Software is a suite of software tools that enables you to maintain, monitor, troubleshoot, and calibrate NI semiconductor test systems. Most test maintenance operations can be performed using NI Maintenance Software.
6. Test Program Development and Debug
This chapter introduces the STS test program architecture, TestStand, the TestStand Semiconductor Module (TSM), and other components/features that customers expect in a standard Semi ATE platform. Related topics such as pin programming, binning, and the Digital Pattern Editor can also be found in this section.
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