NI Connected Summit 2024 - Win-win intelligent testing future, registration is now open, attend the conference to win prizes!
Latest update time：2024-10-15
Reads：
▲
Click on
the blue words
above
to follow us and never miss any valuable articles!
The
NI All-Connected Summit, with the theme of "Win-win Smart Testing Future", will explore the development prospects of smart testing, implementation methods, and win-win through ecological collaboration. As the latest window of NI's "In China, for China", this summit will also focus on showcasing NI's local decision-making + new R&D ideas, and comprehensively promote China's R&D and smart manufacturing with faster service speed and strong local ecology and R&D partners.
The summit includes a keynote speech and four special forums, namely:
LabVIEW and test and measurement technology, new energy vehicles, semiconductors, cutting-edge research (commercial aerospace and university research, etc.). There are also 40+ examples on site to enrich LabVIEW community activities and enjoy a full day of technology feast.
Meeting time:
November 12 (Tuesday)
Meeting place:
Shanghai International Convention Center (No. 2727, Binjiang Avenue, Lujiazui, Pudong New Area)
Registration method:
Click the Register Now button and fill in the form to register for the conference
Gifts for participants
Register
through
EEWorld, attend the conference on the day and complete the on-site sign-in to have a chance to receive the following registration gift (50 gifts in total)
Note: The registration gift is provided by EEWorld and will be distributed within 2 weeks after the event.
Four major themes of the technical sub-forum
A feast of technology, a glimpse of the latest
-
Industry leaders "face to face" communication and sharing
-
Multiple new products released, experience them on site
-
30+ technical presentations
-
40+ examples
-
Hardware training, get the real deal
Community interaction, come up with a plan for "testing"
-
LabVIEW Expert Exchange
-
Hardware product FAQs
-
Service Area
-
Interactive games, etc.
Keynote Speakers
Ritu Favre | President of Emerson Test and Measurement Business Group (formerly NI)
Wang Chengxiang
| Southeast University
Executive Dean of the School of Information
Zhang Ying
| China Automotive Intelligent Technology Co., Ltd.
Assistant to the General Manager
Chen Qiang
| Kangzhuo Electronics
(Wuxi) Co., Ltd.
Operation Director
Chen Zeyuan
| Guangzhou Huizhi Microelectronics Co., Ltd.
Senior R&D Manager
*More guests please stay tuned
· END ·
You are welcome to set us as “
Star
” so that you can receive push messages as soon as possible.
Scan the QR code to follow:
Automotive Development Circle
, reply "
Auto
"
Get the Autosar introductory and practical information package for free!
Scan the QR code to add the assistant and reply "join the group"
Exchange experiences with electronic engineers face to face
【The above content contains advertisements】
京公网安备 11010802033920号