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NI's annual event: The Connected Summit is now open for registration! LabVIEW, new energy vehicles, and cutting-edge technologies are all on display!

Latest update time:2024-10-29
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The NI All-Connected Summit, with the theme of "Win-win Smart Testing Future", will explore the development prospects of smart testing, implementation methods, and win-win through ecological collaboration. As the latest window of NI's "In China, for China", this summit will also focus on showcasing NI's local decision-making + new R&D ideas, and comprehensively promote China's R&D and smart manufacturing with faster service speed and strong local ecology and R&D partners.
The summit includes a keynote speech and four special forums, namely: LabVIEW and test and measurement technology, new energy vehicles, semiconductors, cutting-edge research (commercial aerospace and university research, etc.). There are also 40+ examples on site to enrich LabVIEW community activities and enjoy a full day of technology feast.
Meeting time: November 12 (Tuesday)
Meeting place: Shanghai International Convention Center (No. 2727, Binjiang Avenue, Lujiazui, Pudong New Area)
Registration method: Click the Register Now button and fill in the form to register for the conference


Gifts for participants
Register through EEWorld, attend the conference on the day and complete the on-site sign-in to have a chance to receive the following registration gift (50 gifts in total)
Note: The registration gift is provided by EEWorld and will be distributed within 2 weeks after the event.

Four major themes of the technical sub-forum

A feast of technology, a glimpse of the latest
  • Industry leaders "face to face" communication and sharing
  • Multiple new products released, experience them on site
  • 30+ technical presentations
  • 40+ examples
  • Hardware training, get the real deal
Community interaction, come up with a plan for "testing"
  • LabVIEW Expert Exchange
  • Hardware product FAQs
  • Service Area
  • Interactive games, etc.


Keynote Speakers

Ritu Favre | President of Emerson Test and Measurement Business Group (formerly NI)
Wang Chengxiang | Southeast University Executive Dean of the School of Information
Zhang Ying | China Automotive Intelligent Technology Co., Ltd. Assistant to the General Manager
Chen Qiang | Kangzhuo Electronics (Wuxi) Co., Ltd. Operation Director
Chen Zeyuan | Guangzhou Huizhi Microelectronics Co., Ltd. Senior R&D Manager
*More guests please stay tuned
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