The MAX9959 provides device power (DPS) for automatic test equipment (ATE) or other instruments. Its small size, high integration, and flexibility make the MAX9959 an ideal and economical choice for applications that require power supplies for multiple devices.
The MAX9959 has multiple input control voltages to support independent setting of the output voltage, which can set the maximum and minimum values of the voltage or current (minimum positive polarity or maximum negative polarity). When the load current is between the two set thresholds, the MAX9959 is a voltage source; after reaching the set current threshold, it will smoothly convert to a precise current source. The output has two independent adjustable voltage clamping circuits to limit the negative and positive output voltages between the external levels.
The MAX9959 can provide 25V and up to ±800mA. The DPS supports external buffering to source or sink larger currents. Multiple MAX9959s can be configured in parallel to share the load, thereby outputting higher currents and increasing flexibility.
The MAX9959 operates over a wide range of load conditions. Programmability allows optimization of settling time, overshoot/undershoot, and stability. Internal configurable glitch suppression circuitry reduces output glitches when range changes occur.
The MAX9959 provides 1mV load regulation at 800mA load.
The MAX9959D has an internal 300kΩ sense resistor (RFS) between the RCOMF and SENSE pins; the MAX9959F does not have this sense resistor. These devices are available in a 100-pin TQFP package with an exposed pad on the top for heat dissipation.
Key Features
● 25V output voltage range
● Programmable current and voltage
● Programmable current range
±200uA
±2mA
±20mA
±800mA
● 1mV load regulation at 800mA
● External buffer provides higher current
● Multiple devices connected in parallel provide higher current
● Programmable gain supports a variety of DACs
● Device under test (DUT) ground detection
● Can be set to compensate for a variety of loads
● Integrated go/no-go comparator
● IDDQ test mode
● Range change interference suppression
● Compact (14mm x 14mm) package
● 3-wire serial interface
● Overheat alarm flag and thermal shutdown function
application
Industrial systems
● Memory detector
● Structural testing equipment
● System-on-chip detector
● VLSI detector
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Recommended ReadingLatest update time:2024-11-16 22:47
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