The leakage of a capacitor is measured by applying a fixed voltage to the capacitor and measuring the resulting current. The leakage current will decay exponentially with time, so the voltage must be applied for a known period of time (dwell time) before the current is measured.
For statistical purposes, a certain number of capacitors must be tested to generate useful data. To perform the tests, an automatic switching system is required.
Figure 1 shows a capacitor leakage test system that uses a Keithley Model 6517A electrometer/source, Model 7158 low current scanner card, and a C-type switch card, such as the 7111-S or 7169A. The card is installed in a Model 7002 switch mainframe.
Figure 1. Capacitor leakage test system
In this test system, a set of switches (Model 7111-S or Model 7169A) is used to apply the test voltage to each capacitor. In the normally closed position, one end of the capacitor is connected to the circuit LO. When the switch is actuated, the capacitor is connected to the voltage source. The switches are usually actuated staggered (e.g., 2 seconds apart) so that each capacitor can be charged for the same period of time before leakage is measured. If the maximum test voltage is 110 V or less, the Model 7111-S switch card can be used; otherwise, the Model 7169A switch card can be used to test voltages up to 500 V. If voltages higher than 500 V must be applied, switches with corresponding ratings should be used.
The second set of switches (Model 7158) connects each capacitor to the picoammeter after a suitable settling time. Note that before the capacitor is switched to the picoammeter, it is connected to the circuit LO. This allows the leakage current to continue to flow through its charging device.
For this application, a single instrument provides both voltage sourcing and low current measurement capabilities. The Model 6517A is particularly well suited for this application because it can display resistance or leakage current and source voltages up to 1000 VDC.
After testing the capacitor, the voltage source should be set to zero. Sometimes the capacitor must be discharged before it is removed from the test fixture. Note that the capacitor (C) in Figure 1 forms a discharge path through the normally closed contacts of the relay. The test sequence is synchronized as follows:
Static - Model 7169A relay is normally closed, Model 7158 relay is normally closed.
Apply voltage (dwell time) - 7169A relay is connected to the normally open contacts and 7158 relay remains normally closed.
Measuring current - Model 7169A relay remains in the normally open position and Model 7158 relay is connected to the normally open contacts.
Discharge capacitor - 7169A relay connected to the normally closed contact, 7158 relay connected to the normally closed contact.
Because the isolation switches on the Model 7169A Form C switch card remain energized during the current measurement, any offset current from the switch card is irrelevant to the measurement.
The resistor (R) in series with the capacitor is an important element in this test system. It limits the charging current of each capacitor and protects the relay in the event of a capacitor short circuit. In addition, this resistor limits the AC gain of the feedback ammeter. In general, as the source capacitance increases, the noise gain also increases. This resistor limits the gain to a finite value. A reasonable limit is to make the RC time constant 0.5 to 2 seconds. The forward-biased diode in series with the HI terminal of the electrometer (pA) also serves to limit the AC gain.
A "coax tri-pole to BNC" converter (model 7078-TRX-BNC) is used to connect the 6517A to the 7158 switch card. The capacitors are connected to the 7158 switch card via low noise coaxial cable. Insulated wire can be used to connect the 7111-S switch card to the capacitors. The 7169A is connected via a terminal block connector.
Previous article:Measuring instrument basics (I): Digital voltmeter, application of 7106/7107 digital meter head
Next article:Application of surge absorber in product testing
- Popular Resources
- Popular amplifiers
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
- LED chemical incompatibility test to see which chemicals LEDs can be used with
- Application of ARM9 hardware coprocessor on WinCE embedded motherboard
- What are the key points for selecting rotor flowmeter?
- LM317 high power charger circuit
- A brief analysis of Embest's application and development of embedded medical devices
- Single-phase RC protection circuit
- stm32 PVD programmable voltage monitor
- Introduction and measurement of edge trigger and level trigger of 51 single chip microcomputer
- Improved design of Linux system software shell protection technology
- What to do if the ABB robot protection device stops
- Allegro MicroSystems Introduces Advanced Magnetic and Inductive Position Sensing Solutions at Electronica 2024
- Car key in the left hand, liveness detection radar in the right hand, UWB is imperative for cars!
- After a decade of rapid development, domestic CIS has entered the market
- Aegis Dagger Battery + Thor EM-i Super Hybrid, Geely New Energy has thrown out two "king bombs"
- A brief discussion on functional safety - fault, error, and failure
- In the smart car 2.0 cycle, these core industry chains are facing major opportunities!
- The United States and Japan are developing new batteries. CATL faces challenges? How should China's new energy battery industry respond?
- Murata launches high-precision 6-axis inertial sensor for automobiles
- Ford patents pre-charge alarm to help save costs and respond to emergencies
- New real-time microcontroller system from Texas Instruments enables smarter processing in automotive and industrial applications
- MSP430F5529 ADC Reference Sampling Example
- Detailed explanation of MSP430F149 serial port receiving and sending program
- Those power supply test issues we ignore
- [Activity] Thank you for being here, thank you for the courtesy!
- Heat Transfer: Thermal Management of Power Electronics
- Domestic HGI ultra-low power MCU is here!
- [Attley AT32WB415 series Bluetooth BLE 5.0 MCU] After changing to ATLINK, the first program finally ran
- CircuitPython Diamond
- Headlight test equipment
- [Jihai APM32E103VET6S MINI development board review] Part 2: Timer PWM lighting