Very Large Scale Integrated Circuit Testing (VLSI Testing)

This course is offered by Prof. James Chien-Mo Li, Lab of Dependable Systems, National Taiwan University.
Lecture notes available on course website  http://cc.ee.ntu.edu.tw/~cmli/VLSItes...
This course is based on the teaching materials of late Professor McCluskey, Stanford University

• Chapter 1：Introduction What Is Testing (12 minutes and 37 seconds)

• Chapter 2：Introduction Types Of Tests (30 minutes and 58 seconds)

• Chapter 3：Introduction TestQuality (32 minutes and 9 seconds)

• Chapter 4：Introduction Test Economics (33 minutes and 41 seconds)

• Chapter 5：ReferenceDedication (_optional) (13 minutes and 16 seconds)

• Chapter 6：LogicSim Intro (9 minutes and 37 seconds)

• Chapter 7：LogicSim Model (22 minutes and 9 seconds)

• Chapter 8：LogicSim CompliedCode (12 minutes and 50 seconds)

• Chapter 9：LogicSim EventDriven (26 minutes and 4 seconds)

• Chapter 10：LogicSim Parallel (13 minutes and 13 seconds)

• Chapter 11：LogicSim Issues (_ optional) (21 minutes and 48 seconds)

• Chapter 12：FaultModeling Intro (17 minutes and 23 seconds)

• Chapter 13：FaultModeling SSF (15 minutes and 52 seconds)

• Chapter 14：FaultModeling BridgeFault (19 minutes and 5 seconds)

• Chapter 15：FaultModeling DelayFault (28 minutes and 3 seconds)

• Chapter 16：FaultModeling TransistorFault (_ optional) (26 minutes and 49 seconds)

• Chapter 17：FaultModeling_ FaultDetect,FaultCoverage (20 minutes and 13 seconds)

• Chapter 18：Equivalent Fault Collapsing (18 minutes and 25 seconds)

• Chapter 19：Dominance Fault Collapsing, DFC (_optional) (28 minutes and 34 seconds)

• Chapter 20：FaultSim Intro (15 minutes and 26 seconds)

• Chapter 21：FaultSim Parallel (17 minutes and 0 seconds)

• Chapter 22：FaultSim Deductive (21 minutes and 59 seconds)

• Chapter 23：Concurrent Fault Simulation (14 minutes and 45 seconds)

• Chapter 24：FaultSim DiffFsim (23 minutes and 14 seconds)

• Chapter 25：FaultSim Alternatives (32 minutes and 11 seconds)

• Chapter 26：FaultSim IssueConclusion (_optional) (8 minutes and 38 seconds)

• Chapter 27：Testability Intro (21 minutes and 3 seconds)

• Chapter 28：Testability SCOAPseq (_optional) (28 minutes and 15 seconds)

• Chapter 29：Testability COP (16 minutes and 49 seconds)

• Chapter 30：Combinational ATPG Introduction (14 minutes and 52 seconds)

• Chapter 31：Combinational ATPG (Boolean Difference) (21 minutes and 48 seconds)

• Chapter 32：Combinational ATPG (Single Path Sensitization) (23 minutes and 34 seconds)

• Chapter 33：Combinational ATPG, D_algorithm (33 minutes and 22 seconds)

• Chapter 34：Combinational ATPG, CAN (36 minutes and 28 seconds)

• Chapter 35：Combinational ATPG, FAN (38 minutes and 4 seconds)

• Chapter 36：Combinational ATPG, SAT (8 minutes and 47 seconds)

• Chapter 37：Combinational ATPG, acceleration techniques (34 minutes and 33 seconds)

• Chapter 38：Sequential ATPG Introduction (16 minutes and 13 seconds)

• Chapter 39：Sequential ATPG (9_valued) (11 minutes and 51 seconds)

• Chapter 40：Sequential ATPG (Backward Time Frame Processing) (25 minutes and 10 seconds)

• Chapter 41：Sequential ATPG Simulation (_optional) (27 minutes and 45 seconds)

• Chapter 42：Sequential ATPG Conclusion (_optional) (13 minutes and 14 seconds)

• Chapter 43：DelayTest Intro (20 minutes and 38 seconds)

• Chapter 44：Delay Test _ Path Sensitize (23 minutes and 38 seconds)

• Chapter 45：DelayTest PathTG (26 minutes and 58 seconds)

• Chapter 46：DelayTest PathFsim (26 minutes and 30 seconds)

• Chapter 47：DelayTest TransitionFsimTG (14 minutes and 44 seconds)

• Chapter 48：Diagnosis Intro (20 minutes and 39 seconds)

• Chapter 49：Diagnosis StaticCE (28 minutes and 22 seconds)

• Chapter 50：Diagnosis DynamicCE (18 minutes and 22 seconds)

• Chapter 51：Diagnosis EffectCause (26 minutes and 15 seconds)

• Chapter 52：Diagnosis, Chain Diagnosis (_optional) (28 minutes and 45 seconds)

• Chapter 53：DFT1 Intro (23 minutes and 22 seconds)

• Chapter 54：DFT1 ScanConcepts (21 minutes and 23 seconds)

• Chapter 55：DFT1 _ Test Mode Operation (SSF & Delay Test LOS_LOC) (25 minutes and 49 seconds)

• Chapter 56：DFT1 Muxed_D Scan ATPG model (_optional) (28 minutes and 19 seconds)

• Chapter 57：DFT1 ClockScan (_optional) (13 minutes and 31 seconds)

• Chapter 58：DFT1 LSSD (11 minutes and 58 seconds)

• Chapter 59：DFT1 ScanDesignFlow (36 minutes and 0 seconds)

• Chapter 60：DFT1 IssueSol (26 minutes and 52 seconds)

• Chapter 61：DFT2 JTAG Intro (15 minutes and 38 seconds)

• Chapter 62：DFT2 JTAG Registers (21 minutes and 46 seconds)

• Chapter 63：DFT2 JTAG Instruction (20 minutes and 40 seconds)

• Chapter 64：DFT2 JTAG Instruction (old version) (20 minutes and 59 seconds)

• Chapter 65：DFT2 Instruction2Conclude (15 minutes and 21 seconds)

• Chapter 66：BIST1 Intro (20 minutes and 39 seconds)

• Chapter 67：BIST1 LFSR (36 minutes and 49 seconds)

• Chapter 68：BIST1 _ LFSR seed solving (26 minutes and 24 seconds)

• Chapter 69：BIST1 LFSRpolynomial (29 minutes and 23 seconds)

• Chapter 70：BIST1 CA (29 minutes and 28 seconds)

• Chapter 71：BIST2 Intro (26 minutes and 6 seconds)

• Chapter 72：BIST2 SerialORA (41 minutes and 25 seconds)

• Chapter 73：BIST2 Parallel ORA MISR (30 minutes and 15 seconds)

• Chapter 74：BIST2 Architecture (16 minutes and 41 seconds)

• Chapter 75：BIST2 Design Phase Shifter for LFSR TPG (10 minutes and 29 seconds)

• Chapter 76：BIST2 IssuesConclude (_optional)_2 (34 minutes and 36 seconds)

• Chapter 77：TestCompress Intro (21 minutes and 17 seconds)

• Chapter 78：TestCompress SoftwareSTC (37 minutes and 26 seconds)

• Chapter 79：Test Compress Hardware Stimulus (updated 5_10_2020) (28 minutes and 8 seconds)

• Chapter 80：TestCompress HardwareResponse (_optional) (29 minutes and 49 seconds)

• Chapter 81：MemTest Intro (32 minutes and 24 seconds)

• Chapter 82：Memory Test _ Classical algorithm (23 minutes and 41 seconds)

• Chapter 83：MemTest March (25 minutes and 17 seconds)

• Chapter 84：FunctionTest Intro (19 minutes and 31 seconds)

• Chapter 85：FunctionTest CheckExp (37 minutes and 51 seconds)

• Chapter 86：FunctionTest IOV (34 minutes and 56 seconds)

• Chapter 87：FunctionTest SV (_optional) (15 minutes and 55 seconds)