When the equipment fails to meet the relevant electromagnetic compatibility standards, the reasons for the excessive emission of the equipment should be investigated and then eliminated. In this process, it is often found that many people still fail to eliminate the fault after a long period of effort. The reason for this is that the diagnosis work falls into a "dead loop". This situation can be illustrated by the following example.
Reference address:Common Mistakes in Using Spectrum Analyzers
Assume that a system has excessive emissions during testing, making it unable to meet the electromagnetic radiation limits in the electromagnetic compatibility standard. After preliminary investigation, there may be four reasons, which are:
• Radiated emissions from common-mode currents on the interconnect cable (cable 1) between the host and keyboard
• Radiated emissions from common mode currents on the interconnect cable (cable 2) between the host and printer
• Leakage caused by the gap between the chassis panel and the chassis base (opening 1)
• A display window (opening 2) leaks
During the diagnosis, a ferrite ring was first placed on cable 1 to reduce common mode radiation. It was found that the signal displayed on the spectrum analyzer screen did not decrease significantly. Therefore, the tester believed that cable 1 was not a major leakage source, so the ferrite ring was removed and placed on cable 2. It was found that the signal displayed on the spectrum analyzer screen did not decrease significantly. As a result, the tester concluded that the cable was not the leakage source.
Then the leakage on the chassis was checked again. Opening 1 was blocked with shielding tape, and it was found that the signal displayed on the spectrum analyzer screen did not decrease significantly. The tester believed that opening 1 was not the main source of leakage, so the shielding tape was removed and blocked on opening 2. As a result, the displayed signal on the spectrum analyzer did not decrease. The tester was at a loss. The reason why this problem occurred was that the tester ignored that the signal amplitude displayed on the spectrum analyzer was displayed in dB. Let's take a look at why this phenomenon occurs.
Assuming that the four leakage sources each account for 1/4 of the total radiation, and the measures taken on each radiation source can completely suppress the radiation source, when we take one of the above four measures, the amplitude ΔA of the signal reduction displayed on the spectrum analyzer is:
ΔA=20lg(4/3)=2.5dB
A reduction this small is obviously insignificant, but it has reduced leakage by 25%.
The correct method is that after taking suppression measures for a possible leakage source, even if there is no obvious improvement, do not remove this measure, and continue to take measures for possible leakage sources. When a certain measure is taken, if the interference amplitude is greatly reduced, it does not necessarily mean that this leakage source is the main one, but only that this interference source is the last one. The results of treating the four leakage sources one by one according to this step are shown in Figure 1.
In the previous description, we assumed that after taking measures for a certain leakage source, the leakage source is 100% eliminated. If so, when the last leakage source is removed, the reduction of electromagnetic interference should be infinite. In fact, this is impossible. When we take any measure, it is impossible to eliminate the interference source 100%. The degree of elimination of the leakage source can be 99%, or 99.9%, or even more than 99.99, but it can never be 100%! So when the last leakage source is removed, although the improvement is great, it is still a finite value.
When the equipment fully complies with the relevant regulations, if in order to reduce product costs and unnecessary components, the measures taken can be removed one by one. The first thing to consider is to remove the high-cost components/materials, or measures that are difficult to implement on the official product. If the electromagnetic emission of the product does not exceed the standard after removal, the measure can be removed. Through testing, the product cost can be minimized.
Previous article:Difference between spectrum analyzer and signal analyzer
Next article:Use a spectrum analyzer to analyze the source of interference
- Popular Resources
- Popular amplifiers
Recommended Content
Latest Test Measurement Articles
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
MoreSelected Circuit Diagrams
MorePopular Articles
- LED chemical incompatibility test to see which chemicals LEDs can be used with
- Application of ARM9 hardware coprocessor on WinCE embedded motherboard
- What are the key points for selecting rotor flowmeter?
- LM317 high power charger circuit
- A brief analysis of Embest's application and development of embedded medical devices
- Single-phase RC protection circuit
- stm32 PVD programmable voltage monitor
- Introduction and measurement of edge trigger and level trigger of 51 single chip microcomputer
- Improved design of Linux system software shell protection technology
- What to do if the ABB robot protection device stops
MoreDaily News
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Huawei's Strategic Department Director Gai Gang: The cumulative installed base of open source Euler operating system exceeds 10 million sets
- Download from the Internet--ARM Getting Started Notes
- Learn ARM development(22)
- Learn ARM development(21)
- Learn ARM development(20)
- Learn ARM development(19)
- Learn ARM development(14)
Guess you like
- 【Android development learning path】— by Bingqi23
- MSP430 MCU printf function transplantation
- Keyence vision camera communicates with Siemens 1500 PLC to achieve grasping correction with the robot
- LSM6DSO(X) sensor driver key code analysis: read_data_polling routine (Part 2)
- Xunwei STM32MP157 development board Linux + MCU learning materials and tutorials summary (manual + video)
- Microchip FAQ | TA100-VAO secure boot and message authentication for CAN FD in ADAS and IVI systems
- C2000 Piccolo MCU F28027F LaunchPad Development Kit
- [MPS Mall Big Offer Experience Season] Unboxing
- [ESP32-Korvo Review] Part 4: Text-to-Speech TTS
- [Silicon Labs Development Kit Review] +PDM Stereo Microphone SPK0641HT4H-1