Keysight’s modulation distortion solution helps MISIC accelerate verification of millimeter wave products

Keysight’s modulation distortion solution helps MISIC accelerate verification of millimeter wave products

The solution can realize fast and accurate EVM and noise power ratio testing, speed up the research and development workflow, and reflect the accurate results of the performance of the device under test under the condition of strictly controlling the error interference of the test system.

Keysight Technologies recently announced that the company's S930705B modulation distortion solution has been selected by Microsilicon to perform fast and accurate modulation distortion characterization of the company's millimeter wave active devices and components. Keysight provides advanced design and verification solutions designed to accelerate innovation and create a secure and connected world.

The industry's demand for higher data throughput and lower latency is driving product equipment to move to broadband modulation. However, larger bandwidth will introduce greater noise, which will bring additional test complexity and measurement uncertainty to semiconductor manufacturers such as Microsilicon.

Keysight’s modulation distortion solution helps MISIC accelerate verification of millimeter wave products

By running Keysight's S930705B modulation distortion software on the N5245B PNA-X millimeter wave network analyzer, Microsilicon can use it to test millimeter wave devices without testing due to the extremely low residual EVM of the test system. Gain a complete understanding of device performance in the presence of system disturbances. S930705B can generate modulated signal excitation for non-linear equipment under test to further test the modulation vector error (EVM), noise power ratio (NPR) and adjacent channel power ratio (ACPR) of the DUT. In view of this, Maisilicon can Achieve excellent signal fidelity and precise modulation measurements at 5G, 6G, microwave and millimeter wave frequencies.

Hou Debin, general manager of Maisilicon, said: "Keysight has provided us with a cost-effective test solution that enables us to make highly accurate measurements by eliminating noise and interference from the test system. In the past, if we wanted to perform a complete test on the power amplifier Parameter characterization will require two independent test platforms or a complex and expensive switch matrix. Now Keysight’s test environment built with a single instrument can solve this problem.”

Cao Peng, vice president and general manager of Keysight's Wireless Test Division, said: "Thanks to Keysight's modulation distortion solution, Microsilicon is able to gain a deeper understanding of its test speed and measurement accuracy with a perfect combination. product performance and accelerates the development process. As an integrated solution, this avoids the complex environment of an entire rack of test instruments and reduces the cost of device development and verification.”