[October 24 | KEE Master Cloud Classroom] Issue 10: Millimeter-wave component characterization and test technology

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Keysight Engineering Education

The tenth lecture will be held on October 24

Millimeter-wave component characterization and testing technology

>>> Speaker: Suren Singh, Industry Application Expert at Deutsche Telekom

Users need to transmit massive amounts of data at high speeds, and using millimeter wave bands to meet user needs has become an important part of 5G communications. R&D centers and manufacturers need to be able to fully characterize and test millimeter wave active and passive components. This course will focus on how to use a vector network analyzer to characterize and test the characteristics of passive and active devices.

This course will cover:

1. Why characterize mmWave components?

2. What are the millimeter wave components?

3. Practical measurement methods for these devices are presented and examples are given for demonstration.

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Please register for this event first, then make an appointment

Speakers

Suren Singh

Keysight Technologies Industry Application Experts

Mr. Suren Singh joined HP in 1986 and has worked in HP/Agilent/Keysight for over 30 years. His experience at Keysight includes application engineering, product design, manufacturing and test process development for microwave hybrid microcircuits. He currently serves as an application expert business manager focusing on terahertz measurement solutions. In addition, he is responsible for metrology products for performance network analyzers, including calibration and verification.

Suren Singh received his B.Eng degree in Electronic Engineering from the University of Durban-Westville, Durban, South Africa and his M.Eng degree in Electronic Engineering from the University of the Witwatersrand, Johannesburg, South Africa in December 1992.

Technical communication expert

Cha Haihui

Application Engineer at Keysight Technologies

Mr. Cha Haihui joined Keysight Technologies in 2016 as an application engineer at Keysight Technologies, focusing on RF microwave and semiconductor device testing and related applications. He is mainly responsible for technical support for related products and solutions such as network analyzers, LCR/impedance meters, signal sources, signal analyzers and semiconductor parameter analyzers.

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January 24: Fundamentals of Spectrum Analysis

February 7: Signal Generation and Digital Modulation Technology

March 28th "PCIe 4.0 Technology Update and Test Plan"

April 26: RF and Microwave Device Measurement

May 30, "Location Technology for Non-cooperative Signal Emitters"

June 27, "Using Network Analyzers to Make Accurate Signal Integrity Measurements"

July 25, "Phase Noise Measurement Basics"

August 29, Power Integrity

September 19, Oscilloscope probe is very important, will you choose it?

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