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BCX19

File Size475KB,2 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

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BCX19 Parametric

Parameter NameAttribute value
Transistor typeNPN
Collector-emitter breakdown voltage (Vceo)45V
Collector current (Ic)500mA
Power(Pd)225mW
Collector-emitter saturation voltage (VCE(sat)@Ic,Ib)620mV@500mA,50mA
DC current gain (hFE@Ic,Vce)100@100mA,1V
Characteristic frequency (fT)-
Operating temperature-55℃~+150℃@(Tj)

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JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOT-23 Plastic-Encapsulate Transistors
BCX19
FEATURES
Low voltage
MARKING : U1
MAXIMUM RATINGS(Ta=25℃ unless otherwise noted)
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
T
J
, T
stg
Parameter
Collector-Base Voltage
Collector-Emitter Voltage
Emitter-Base Voltage
Collector Current -Continuous
Collector Dissipation
Junction and Storage Temperature
Value
50
45
5
500
225
-55-150
Units
V
V
V
mA
mW
SOT-23
TRANSISTOR (NPN)
1. BASE
2. EMITTER
3. COLLECTOR
ELECTRICAL CHARACTERISTICS (Ta=25℃ unless otherwise specified)
Parameter
Collector-emitter breakdown voltage
Collector-emitter breakdown voltage
Emitter-base breakdown voltage
Collector cut-off current
Collector cut-off current
DC current gain
Symbol
V
(BR)CBO
V
(BR)CEO
V
(BR)EBO
I
CBO
I
EBO
h
FE1
h
FE2
h
FE3
Collector-emitter saturation voltage
Base-emitter voltage
V
CE(sat)
V
BE(on)
Test
conditions
Min
50
45
5
0.1
10
100
70
40
0.62
1.2
V
V
600
Typ
Max
Unit
V
V
V
μ
A
μ
A
I
C
=100μA, I
E
=0
= 0
I
C
=10mA, I
B
I
E
=100
μ
A, I
C
=0
= 0
V
CB
=20V , I
E
= 0
V
EB
=5V , I
C
V
CE
= 1V, = 100mA
I
C
V
CE
= 300mA
= 1V, I
C
V
CE
= 500mA
= 1V, I
C
Ic=500mA,
I
B
= 50mA
Ic=500mA, V
CE
= 1V
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