RF Components Test Technology Seminar for 5G - You are invited to attend!

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RF Components Test Technology Seminar for 5G - You are invited to attend! [Copy link]

Rohde & Schwarz (hereinafter referred to as R&S) sincerely invites you to participate in the "2019 RF Component Test Technology Seminar for 5G".

Time and location of the meeting:

October 14, Beijing

October 16th Shanghai

October 18, Shenzhen

Participants will have the opportunity to learn about:

• Advanced Phased Array Antenna Test Technology
• Latest Phase Noise and Jitter Test Technology
• Using on-wafer load-pull technology to test 5G millimeter-wave chip characteristics
• Advanced Data Converter Integration Simplifies Wideband Multi-Antenna Applications
• 5G mmWave OTA Testing - From RFIC to Terminal
• High-speed passive channel modeling and calibration - Challenges of passive channels in the 5G era
• ……

In this seminar, German and local technical experts from R&S and partners will combine the latest 5G NR new technologies to explain in depth RF component testing technology, testing challenges and solutions.

>>>Click here to register for the conference

After successful registration, you will enjoy the following services:

▍Reserved seats

▍Download electronic version of the document

▍On-site engineer consulting services

▍A beautiful gift

▍Buffet lunch and refreshments

After the meeting, participating customers scan the QR code to complete the questionnaire and receive exquisite gifts as a thank you.