Current status of LED related standards at home and abroad, LED industry standards

Publisher:少年不识愁滋味Latest update time:2011-10-19 Source: 中国LED照明网Keywords:led Reading articles on mobile phones Scan QR code
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1. Current status of foreign LED related standards, current status of LED standards, current status of LED national standards - LED industry standards

Strictly speaking, there is no standard specifically named semiconductor lighting in China, and there is no standard specifically named semiconductor lighting abroad. There are only testing standards for ordinary LEDs and lighting standards related to ordinary light sources. The testing standards for ordinary LEDs are:

( 1)IEC60747-5 Semiconductor devices Discrete devices and integrated circuits(1992)

IEC60747-5 Semiconductor discrete devices and integrated circuits

( 2)IEC60747-5-2 Discrete semiconductor devices and integrated circuits-Part 5-2:Optoelectronic devices-Essential ratings and characteristics (1997-09)

IEC60747-5-2 Discrete semiconductor devices and integrated circuit components 5-2: Optoelectronic devices - Classification characteristics and elements (1997-09)

( 3)IEC60747-5-3 Discrete semiconductor devices and integrated circuits-Part 5-3 :Optoelectronic devices-Measuring methods(1997-08)

IEC60747-5-3 Discrete semiconductor devices and integrated circuits

Component 5-3: Optoelectronic Devices - Test Methods (1997-08)

( 4)IEC60747-12-3 Semiconductor devices-part12-3: optoelectronic devices –Blank detail specification for light-emitting diodes –Display application(1998-02)

IEC60747-12-3 Semiconductor Discrete Devices 12-3: Optoelectronic Devices - Blank Detailed Standard for Light Emitting Diodes for Display Applications (1998-02)

( 5)CIE127-1997 Measurement of LEDs(1997)

CIE127-1997 LED test method (1997)

( 6) CIE/ISO standards on LED intensity measurements

CIE/ISO LED intensity test standards

In 1997, the International Commission on Illumination (CIE) published the CIE127-1997 LED test method, which defined the LED intensity test as the concept of average intensity and stipulated a unified test structure and detector size, thus laying the foundation for accurate LED testing and comparison. Although the CIE 127-1997 test method is not an international standard, it is easy to implement accurate testing and comparison, and is currently adopted by major companies in the world. However, with the rapid development of technology, many new LED technical characteristics are not covered by the CIE127-1997 LED test method.

At present, with the rapid development of semiconductor lighting industry, developed countries attach great importance to the formulation of LED testing standards. For example, the National Institute of Standards and Technology (NIST) of the United States is conducting research on LED testing methods and is preparing to establish a complete set of LED testing methods and standards. At the same time, the research and development personnel of many large foreign companies are actively participating in national and international professional organizations to formulate semiconductor lighting testing standards. For example, on October 28, 2002, Lumileds of the United States and Nichia of Japan announced that the two parties would cross-license their respective LED technologies and prepare to jointly formulate power LED standards to promote market applications.

2. Current status of domestic LED related standards--LED national standards

At present, there are no comprehensive national and LED industry testing standards for LEDs and their lighting fixtures in China, nor are there corresponding testing systems. In production, companies often use the parameters of sample tubes as a basis for comparison. There are often great disputes among relevant manufacturers, users, research institutes, and universities of different natures. This inconsistency in the understanding of standards within the academic community, within the business community, and between each other has seriously hindered the application and industrialization of products. Although some companies and research institutions have purchased some testing equipment, due to the lack of professional research, the equipment level is low, the instrument matching is poor, the detection accuracy is low, and the test results are difficult to compare with each other, and the test items cannot meet the needs of users. Domestic professional testing institutions have carried out some LED testing and research work, but due to limited conditions, a complete testing and evaluation system has not yet been formed, and the testing level is far behind that of developed countries abroad.

Since the early 1980s, my country has successively formulated a number of industry standards and national standards related to light-emitting diodes. The existing domestic standards related to LED testing are:

(1) Sj2353.3-83 Semiconductor light emitting diode test method

(2) Sj2658-86 Semiconductor infrared light emitting diode test method

(3) GB/T12561-1990 Blank Detailed Specification for Light Emitting Diodes

(4) GB/T15651-1995 Semiconductor devices, discrete devices and integrated circuits: optoelectronic devices (national standard)

(5) GB/T18904.3-2002 Semiconductor Devices 12-3: Blank Detailed Specification for Light Emitting Diodes for Optoelectronic Device Displays (adopting IEC60747-12-3:1998)

(6) Semiconductor discrete devices and integrated circuits Part 5-2: Basic ratings and characteristics of optoelectronic devices (national standard; under preparation)

(7) Semiconductor discrete devices and integrated circuits Part 5-3: Test methods for optoelectronic devices (national standard; under preparation)

(8) Semiconductor Light Emitting Diode Test Method (China Optical Association Optoelectronic Devices Branch Standard; 2002

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