1. Current status of foreign LED related standards, current status of LED standards, current status of LED national standards - LED industry standards
Strictly speaking, there is no standard specifically named semiconductor lighting in China, and there is no standard specifically named semiconductor lighting abroad. There are only testing standards for ordinary LEDs and lighting standards related to ordinary light sources. The testing standards for ordinary LEDs are:
( 1)IEC60747-5 Semiconductor devices Discrete devices and integrated circuits(1992)
IEC60747-5 Semiconductor discrete devices and integrated circuits
( 2)IEC60747-5-2 Discrete semiconductor devices and integrated circuits-Part 5-2:Optoelectronic devices-Essential ratings and characteristics (1997-09)
IEC60747-5-2 Discrete semiconductor devices and integrated circuit components 5-2: Optoelectronic devices - Classification characteristics and elements (1997-09)
( 3)IEC60747-5-3 Discrete semiconductor devices and integrated circuits-Part 5-3 :Optoelectronic devices-Measuring methods(1997-08)
IEC60747-5-3 Discrete semiconductor devices and integrated circuits
Component 5-3: Optoelectronic Devices - Test Methods (1997-08)
( 4)IEC60747-12-3 Semiconductor devices-part12-3: optoelectronic devices –Blank detail specification for light-emitting diodes –Display application(1998-02)
IEC60747-12-3 Semiconductor Discrete Devices 12-3: Optoelectronic Devices - Blank Detailed Standard for Light Emitting Diodes for Display Applications (1998-02)
( 5)CIE127-1997 Measurement of LEDs(1997)
CIE127-1997 LED test method (1997)
( 6) CIE/ISO standards on LED intensity measurements
CIE/ISO LED intensity test standards
In 1997, the International Commission on Illumination (CIE) published the CIE127-1997 LED test method, which defined the LED intensity test as the concept of average intensity and stipulated a unified test structure and detector size, thus laying the foundation for accurate LED testing and comparison. Although the CIE 127-1997 test method is not an international standard, it is easy to implement accurate testing and comparison, and is currently adopted by major companies in the world. However, with the rapid development of technology, many new LED technical characteristics are not covered by the CIE127-1997 LED test method.
At present, with the rapid development of semiconductor lighting industry, developed countries attach great importance to the formulation of LED testing standards. For example, the National Institute of Standards and Technology (NIST) of the United States is conducting research on LED testing methods and is preparing to establish a complete set of LED testing methods and standards. At the same time, the research and development personnel of many large foreign companies are actively participating in national and international professional organizations to formulate semiconductor lighting testing standards. For example, on October 28, 2002, Lumileds of the United States and Nichia of Japan announced that the two parties would cross-license their respective LED technologies and prepare to jointly formulate power LED standards to promote market applications.
2. Current status of domestic LED related standards--LED national standards
At present, there are no comprehensive national and LED industry testing standards for LEDs and their lighting fixtures in China, nor are there corresponding testing systems. In production, companies often use the parameters of sample tubes as a basis for comparison. There are often great disputes among relevant manufacturers, users, research institutes, and universities of different natures. This inconsistency in the understanding of standards within the academic community, within the business community, and between each other has seriously hindered the application and industrialization of products. Although some companies and research institutions have purchased some testing equipment, due to the lack of professional research, the equipment level is low, the instrument matching is poor, the detection accuracy is low, and the test results are difficult to compare with each other, and the test items cannot meet the needs of users. Domestic professional testing institutions have carried out some LED testing and research work, but due to limited conditions, a complete testing and evaluation system has not yet been formed, and the testing level is far behind that of developed countries abroad.
Since the early 1980s, my country has successively formulated a number of industry standards and national standards related to light-emitting diodes. The existing domestic standards related to LED testing are:
(1) Sj2353.3-83 Semiconductor light emitting diode test method
(2) Sj2658-86 Semiconductor infrared light emitting diode test method
(3) GB/T12561-1990 Blank Detailed Specification for Light Emitting Diodes
(4) GB/T15651-1995 Semiconductor devices, discrete devices and integrated circuits: optoelectronic devices (national standard)
(5) GB/T18904.3-2002 Semiconductor Devices 12-3: Blank Detailed Specification for Light Emitting Diodes for Optoelectronic Device Displays (adopting IEC60747-12-3:1998)
(6) Semiconductor discrete devices and integrated circuits Part 5-2: Basic ratings and characteristics of optoelectronic devices (national standard; under preparation)
(7) Semiconductor discrete devices and integrated circuits Part 5-3: Test methods for optoelectronic devices (national standard; under preparation)
(8) Semiconductor Light Emitting Diode Test Method (China Optical Association Optoelectronic Devices Branch Standard; 2002
Previous article:LED quality control, issues that should be paid attention to in the LED production process
Next article:Electronics Encyclopedia Knowledge: The structure of LED light-emitting diodes
Recommended ReadingLatest update time:2024-11-16 19:55
- Popular Resources
- Popular amplifiers
- MathWorks and NXP Collaborate to Launch Model-Based Design Toolbox for Battery Management Systems
- STMicroelectronics' advanced galvanically isolated gate driver STGAP3S provides flexible protection for IGBTs and SiC MOSFETs
- New diaphragm-free solid-state lithium battery technology is launched: the distance between the positive and negative electrodes is less than 0.000001 meters
- [“Source” Observe the Autumn Series] Application and testing of the next generation of semiconductor gallium oxide device photodetectors
- 采用自主设计封装,绝缘电阻显著提高!ROHM开发出更高电压xEV系统的SiC肖特基势垒二极管
- Will GaN replace SiC? PI's disruptive 1700V InnoMux2 is here to demonstrate
- From Isolation to the Third and a Half Generation: Understanding Naxinwei's Gate Driver IC in One Article
- The appeal of 48 V technology: importance, benefits and key factors in system-level applications
- Important breakthrough in recycling of used lithium-ion batteries
- Innolux's intelligent steer-by-wire solution makes cars smarter and safer
- 8051 MCU - Parity Check
- How to efficiently balance the sensitivity of tactile sensing interfaces
- What should I do if the servo motor shakes? What causes the servo motor to shake quickly?
- 【Brushless Motor】Analysis of three-phase BLDC motor and sharing of two popular development boards
- Midea Industrial Technology's subsidiaries Clou Electronics and Hekang New Energy jointly appeared at the Munich Battery Energy Storage Exhibition and Solar Energy Exhibition
- Guoxin Sichen | Application of ferroelectric memory PB85RS2MC in power battery management, with a capacity of 2M
- Analysis of common faults of frequency converter
- In a head-on competition with Qualcomm, what kind of cockpit products has Intel come up with?
- Dalian Rongke's all-vanadium liquid flow battery energy storage equipment industrialization project has entered the sprint stage before production
- Allegro MicroSystems Introduces Advanced Magnetic and Inductive Position Sensing Solutions at Electronica 2024
- Car key in the left hand, liveness detection radar in the right hand, UWB is imperative for cars!
- After a decade of rapid development, domestic CIS has entered the market
- Aegis Dagger Battery + Thor EM-i Super Hybrid, Geely New Energy has thrown out two "king bombs"
- A brief discussion on functional safety - fault, error, and failure
- In the smart car 2.0 cycle, these core industry chains are facing major opportunities!
- The United States and Japan are developing new batteries. CATL faces challenges? How should China's new energy battery industry respond?
- Murata launches high-precision 6-axis inertial sensor for automobiles
- Ford patents pre-charge alarm to help save costs and respond to emergencies
- New real-time microcontroller system from Texas Instruments enables smarter processing in automotive and industrial applications
- FreeRTOS MPU makes the system more robust!
- Single package, small size drive motor controller is here
- How to debug multiple DSPs?
- Application of 7-inch serial port screen in washing and drying machine
- [RVB2601 Creative Application Development] Bring up the development board and light up the LED
- TI C6000 DSP Notes
- [Chuanglong Technology Allwinner A40i development board] Unboxing experience
- Can OTP be written via communication?
- STM32L0 LL library IIC configuration and usage issues, can't send the data I want. Ask for advice
- Keil C51 cracking problem