Analysis of the principles and functions of AT256 A4 pro4 full variety integrated circuit screening tester

AT256 A4 pro4 full variety integrated circuit screening tester

British abi_AT256 A4 pro4 full variety integrated circuit screening tester channel configuration:

Special VI dynamic impedance port test channels for two-dimensional integrated circuits: 256 channels

Special VI dynamic impedance port test channels for 2D circuit boards: 256 channels (can be expanded to 2048 channels)

Three-dimensional frequency sweep VIF dynamic impedance port test channels: 256 channels (can be expanded to 2048 channels)

Functional use:

1) Incoming material quality control testing, screening and consistency testing of integrated circuits;

2) Quickly screen counterfeit and imitation integrated circuits and components;

3) Conduct three-dimensional dynamic impedance failure analysis on defective devices;

4) Conduct comprehensive port dynamic impedance test and analysis on integrated circuits and circuit boards under non-power-on conditions;

5) Quickly and accurately locate fault pins of failed integrated circuits and efficiently find failed I/O pins of faulty circuit boards;

6) The test is safe and reliable, comprehensively solves the problems of device technology and circuit board technology, and quickly solves the problem of locating fault points of integrated circuits and circuit boards;

7) Conduct impedance consistency testing of integrated circuits and circuit boards;

8) Cooperate with special measurement and control platform software to realize customized and customized programming testing of integrated circuits and circuit boards.

British abi_AT256 A4 pro4 full variety integrated circuit screening tester technical specifications:

1) 256-channel dedicated VI port dynamic impedance test channel for two-dimensional integrated circuits;

2) 256-channel dynamic impedance test channel dedicated to the VI port of the two-dimensional circuit board;

3) 256 VIF three-dimensional dynamic impedance test channels;

4) 4-way probe test, 4-way VT/VTF test channels;

5) Display graphics mode: VI, VT, VIF, VTF;

6) Various packaging general integrated circuit test fixtures can be customized;

7) Various circuit board I/O interface test fixtures can be customized;

8) The system provides customized test report output; special test operation software in Chinese and English;

9) The equipment can be expanded to 2048 sets of test channels in steps of 64 channels.

Test principle (VI curve test):

Apply a safe, low-power scan drive signal to each pin of the component to generate an impedance characteristic map for comparison and storage.

The device under test is compared with the standard dynamic impedance diagram in the database. The difference in the impedance diagram can determine the quality and availability of the component.

The parameters that can be set for the test signal include: voltage, waveform, source resistance, frequency. Adjustments can be made as needed for accurate information.

Integrated circuit testing operation is so simple:

1. Select the integrated circuit model to be tested from the database.

2. Insert the integrated circuit into the test socket.

3. Execute tests

4. Get the test result of PASS or FAIL.

No electronics expertise is required.

Applicable to all integrated circuits/packages. and various types of circuit boards.

Flexible, easy to install and easy to operate.

The test result is direct: PASS or FAIL.

The software can set various test conditions.

A complete integrated circuit custom test analysis report can be provided.

The British ABI-AT256 A4 pro4 full variety integrated circuit tester is suitable for components in different packaging forms:

-Dual Pin-in-Line (DIL)

-Small Outline Integrated Circuit (SOIC)

-Small package (SSOP, TSOP)

-Plastic Leadless Chip Carrier Package (PLCC)

-Quad Flat Package (TQFP, PQFP, LQFP)

-Goal array package (BGA)

Note: AT256 A4 pro4 is not limited to testing electronic integrated circuits, but can also be used to test entire circuit boards.