Because LabVIEW is a graphical programming interface, its event handling is different from event handling in other programming languages. The following list provides instructions and suggestions for using events in LabVIEW applications.
Keywords:LabVIEW
Reference address:Notes and suggestions for using events in LabVIEW
- Avoid using event structures outside of loops.
- Remember to read the terminal of the trigger Boolean control in the Value Change event case.
- Use the Case structure to handle the undo operation of a triggered Boolean control.
- Use caution when configuring a conditional branch to handle actions for multiple notification events.
- Do not configure a branch to process multiple filter events with different event data.
- If a While Loop containing an Event structure terminates based on the value of a Triggered Stop Boolean control, remember to handle the Triggered Stop Boolean control in the Event structure.
- If you do not need to monitor specific front panel objects programmatically, consider using the Wait On Front Panel Activity function.
- UI events are only available for direct user interaction.
- Avoid using both dialog boxes and "mouse down?" filter events in the same event branch.
- Avoid placing two Event structures in a loop.
- When using dynamic registration, make sure each Event structure has a Register Events function.
- When you use a subpanel control, the top-level VI that contains the subpanel control handles the events.
- If you need to generate or handle other events while processing the current event, consider using the event callback registration function.
- Choose notification or filter events carefully. You use an event case to handle notification events and will not affect how LabVIEW handles user interactions. Use filter events to change whether or how LabVIEW handles user interactions.
- Do not use the Panel Close Notification event in critical shutdown code unless you take steps to ensure that the VI does not abort when the front panel closes. For example, make sure that the application opens a reference to the VI before the user closes the front panel. Alternatively, use the Panel Close? filter event, which occurs before the panel closes.
Previous article:The corresponding relationship between the type output value and its event name in the labview event structure
Next article:Outputting an image from a graph using an Invoke Node
Recommended ReadingLatest update time:2024-11-23 08:39
Temperature measurement and control system composition and temperature signal generation and processing
When we developed the nitrogen oxide chemiluminescence analyzer, the entire system required temperature measurement and control in three places: the reaction chamber, the molybdenum conversion chamber, and the photon counter PMT. The temperature in the reaction chamber has a certain impact on the chemical reaction (ni
[Test Measurement]
Intelligent UHV tester system based on UV detection method
Abstract: A design scheme of intelligent UHV tester system based on DSP and LabVIEW is proposed. DSP is used as the core of the on-site intelligent UHV tester system, LabVIEW is used as the development platform for the host computer management system software, and the field bus CAN is used to transmit the data colle
[Power Management]
Interface Design of Handheld Digital Waveform Table Based on LabVIEW
The virtual instrument program designed by LabVIEW is transplanted to the portable handheld device running WindowsCE. It can greatly improve the efficiency of embedded system software development. Specifically, an interface design that effectively solves the problem of alternating display of data waveforms is propos
[Test Measurement]
LabVIEW VI Properties
The VI framework discussed above is displayed to developers, and developers can also directly set and modify the content in the framework. This part of the content is finally recorded and saved in the form of .vi. In fact, this file also records and saves a lot of other information about the VI. These information that
[Test Measurement]
Elevator upward overspeed protection device detection system based on virtual instrument
0 Introduction
Elevators are widely used in various places as a kind of lifting and transportation equipment for people. It is very important to ensure the safety and reliability of elevators. According to the working principle of traction elevators, more than half of the time in the operation of the elevator is
[Test Measurement]
Using LabVIEW to implement synchronous measurement
Whether you are working with different subsystems within a single data acquisition device or need to synchronize multiple data acquisition devices in a high-channel-count system, NI LabVIEW 2010 makes synchronization of data acquisition and generation simple.
Timing and synchronization techniques relate or coordinate
[Test Measurement]
Implement application solutions for instrument drive systems in the LabVIEW development environment
The virtual instrument development platform LabVIEW (LaboratoryVirtual Instrument Engineering Work bench) launched by the American NI Company is currently the most widely used, fastest growing, and most powerful graphical software development environment. LabVIEW has significant advantages in instrument control, data
[Test Measurement]
LabVIEW Serial Port Debugging Notes
Use the Simplified Chinese version of LabVIEW 2011, and then you need to install the VISA driver (you can download the driver and LabVIEW software on eMule, but the LabVIEW on eMule is the English version. If you need the Simplified Chinese version, you can download it here http://ftp.ni.com/evaluation/labview/ekit/oth
[Test Measurement]
- Popular Resources
- Popular amplifiers
- 100 Examples of Microcontroller C Language Applications (with CD-ROM, 3rd Edition) (Wang Huiliang, Wang Dongfeng, Dong Guanqiang)
- Arduino Nano collects temperature and humidity data through LabVIEW and DHT11
- Modern Testing Technology and System Integration (Liu Junhua)
- Computer Control System Analysis, Design and Implementation Technology (Edited by Li Dongsheng, Zhu Wenxing, Gao Rui)
Recommended Content
Latest Test Measurement Articles
- New IsoVu™ Isolated Current Probes: Bringing a New Dimension to Current Measurements
- Modern manufacturing strategies drive continuous improvement in ICT online testing
- Methods for Correlation of Contact and Non-Contact Measurements
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
MoreSelected Circuit Diagrams
MorePopular Articles
- Intel promotes AI with multi-dimensional efforts in technology, application, and ecology
- ChinaJoy Qualcomm Snapdragon Theme Pavilion takes you to experience the new changes in digital entertainment in the 5G era
- Infineon's latest generation IGBT technology platform enables precise control of speed and position
- Two test methods for LED lighting life
- Don't Let Lightning Induced Surges Scare You
- Application of brushless motor controller ML4425/4426
- Easy identification of LED power supply quality
- World's first integrated photovoltaic solar system completed in Israel
- Sliding window mean filter for avr microcontroller AD conversion
- What does call mean in the detailed explanation of ABB robot programming instructions?
MoreDaily News
- STMicroelectronics discloses its 2027-2028 financial model and path to achieve its 2030 goals
- 2024 China Automotive Charging and Battery Swapping Ecosystem Conference held in Taiyuan
- State-owned enterprises team up to invest in solid-state battery giant
- The evolution of electronic and electrical architecture is accelerating
- The first! National Automotive Chip Quality Inspection Center established
- BYD releases self-developed automotive chip using 4nm process, with a running score of up to 1.15 million
- GEODNET launches GEO-PULSE, a car GPS navigation device
- Should Chinese car companies develop their own high-computing chips?
- Infineon and Siemens combine embedded automotive software platform with microcontrollers to provide the necessary functions for next-generation SDVs
- Continental launches invisible biometric sensor display to monitor passengers' vital signs
Guess you like
- SURUIDE decodes TANK300 Liema application headlight follow-up steering headlight lighting system DEMO
- Embedded engineer recruitment, salary matching first-tier cities
- Electronic Design Competition Dot Matrix Electronic Display Screen Information
- Introduction to TOPWAY Intelligent Module Interface Development Tool
- About copper plating rule setting
- Recruiting WIFI/BT/GPS (any direction) technical experts
- D-Class AMP Load RL Headphone Connection Problem
- Analog Electronics Course Test + Data Converter Introduction - DC Parameters
- How to measure the inductor current in a switching power supply
- [MM32 eMiniBoard Review] Using MM32-LINK under IAR