Digital phosphor oscilloscopes are powerful and can capture, display and analyze complex signals. With flexible sampling methods and automatic digital measurement functions, they have become the best in the measurement field. The commonly used TDS3000 series has a sampling rate of 1.25-5GS/s and a bandwidth of 100-500MHz. The TDS500/700 series has a sampling rate of 2-4GS/s and a bandwidth of 0.5-2GHz. DPO has such superior performance, so of course it will not be cheap. In order to give full play to the performance of DPO, it is mainly used for the detection of complex signal flares.
Question 1: How can we test the signal quality of 100M Ethernet and Gigabit Ethernet in a simple and easy way? How many desktop devices are recommended? How many portable devices are recommended?
Answer 1: The Ethernet physical layer signal quality test can use the industry-wide solution provided by Tektronix. Question
2: How to perform power supply testing with a digital phosphor oscilloscope?
Answer 2: Tektronix provides a full set of power supply testing solutions, including various current probes, voltage probes, and analysis software. The testable current amplitude ranges from 1mV to 20KV, and the bandwidth ranges from DC to 2GHz; the testable voltage ranges from 1mV to 40KV, and the bandwidth ranges from DC to 1GHz (low voltage can reach 16GHz), which are the widest ranges in the industry. The testable items include: switching loss and safe working area of switching devices; inductance, magnetic loss, BH curve, conductivity of magnetic components; ripple, power factor, current harmonic analysis of power supply, etc. Among them, many test items are only provided by Tektronix.
Question 3: Application of digital phosphor oscilloscope in automotive electronic design and debugging.
Answer 3: Digital phosphor oscilloscope provides timing and protocol decoding and analysis functions for CN bus and LIN bus. It can synchronously decode control networks with CN and LIN buses, and test transmission accuracy and error tolerance between networks. Network synchronization faults can be located by testing crystal tolerance and transmission delay. Fault debugging on the data link layer is realized through the integrated search function. Through the eye diagram test of CN signal, the noise on CN data packet caused by jitter, amplitude distortion and burr can be analyzed. Complex trigger conditions can be used: frame type (data, remote, error, overload), identifier, data, confirmation loss and bit stuffing error to trigger the acquisition of positioning signal characteristics and faults. (end)
Reference address:Several questions about digital phosphor oscilloscope
Question 1: How can we test the signal quality of 100M Ethernet and Gigabit Ethernet in a simple and easy way? How many desktop devices are recommended? How many portable devices are recommended?
Answer 1: The Ethernet physical layer signal quality test can use the industry-wide solution provided by Tektronix. Question
2: How to perform power supply testing with a digital phosphor oscilloscope?
Answer 2: Tektronix provides a full set of power supply testing solutions, including various current probes, voltage probes, and analysis software. The testable current amplitude ranges from 1mV to 20KV, and the bandwidth ranges from DC to 2GHz; the testable voltage ranges from 1mV to 40KV, and the bandwidth ranges from DC to 1GHz (low voltage can reach 16GHz), which are the widest ranges in the industry. The testable items include: switching loss and safe working area of switching devices; inductance, magnetic loss, BH curve, conductivity of magnetic components; ripple, power factor, current harmonic analysis of power supply, etc. Among them, many test items are only provided by Tektronix.
Question 3: Application of digital phosphor oscilloscope in automotive electronic design and debugging.
Answer 3: Digital phosphor oscilloscope provides timing and protocol decoding and analysis functions for CN bus and LIN bus. It can synchronously decode control networks with CN and LIN buses, and test transmission accuracy and error tolerance between networks. Network synchronization faults can be located by testing crystal tolerance and transmission delay. Fault debugging on the data link layer is realized through the integrated search function. Through the eye diagram test of CN signal, the noise on CN data packet caused by jitter, amplitude distortion and burr can be analyzed. Complex trigger conditions can be used: frame type (data, remote, error, overload), identifier, data, confirmation loss and bit stuffing error to trigger the acquisition of positioning signal characteristics and faults. (end)
Previous article:How do I calibrate an oscilloscope?
Next article:Open FPGA increases test flexibility
- Popular Resources
- Popular amplifiers
Recommended Content
Latest Test Measurement Articles
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
MoreSelected Circuit Diagrams
MorePopular Articles
- LED chemical incompatibility test to see which chemicals LEDs can be used with
- Application of ARM9 hardware coprocessor on WinCE embedded motherboard
- What are the key points for selecting rotor flowmeter?
- LM317 high power charger circuit
- A brief analysis of Embest's application and development of embedded medical devices
- Single-phase RC protection circuit
- stm32 PVD programmable voltage monitor
- Introduction and measurement of edge trigger and level trigger of 51 single chip microcomputer
- Improved design of Linux system software shell protection technology
- What to do if the ABB robot protection device stops
MoreDaily News
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Huawei's Strategic Department Director Gai Gang: The cumulative installed base of open source Euler operating system exceeds 10 million sets
- Download from the Internet--ARM Getting Started Notes
- Learn ARM development(22)
- Learn ARM development(21)
- Learn ARM development(20)
- Learn ARM development(19)
- Learn ARM development(14)
Guess you like
- Rapid Design of TMS320LF2407 Program Based on Matlab
- MSP430G2553 collects AC VPP
- Watch the video and share 3000 yuan: Dr. Chen Qiaoliang talks about MOSFET selection principles and typical application cases
- 3m semi-anechoic chamber, 10m semi-anechoic chamber
- N32G430C8L7 development board ADC temperature test
- [Xianji HPM6750EVKMINI Review] 6# HPM6750 for SD Operation
- [Erha Image Recognition Artificial Intelligence Vision Sensor] 2. Firmware upgrade & power-on experience face recognition and object recognition
- Multimeter and infrared thermometer are waiting for you to disassemble! —— EEWorld disassembles for you to play (Part 2)
- Google Chrome homepage is changed automatically for no apparent reason?
- Newbie asks for help: "Can the SMA interface antenna and antenna base hardware be connected?"