NDT is the abbreviation of non-destructive testing.
NDT refers to a method of testing materials or workpieces that does not damage or affect their future performance or use.
By using NDT, defects inside and on the surface of materials or workpieces can be found, the geometric features and dimensions of workpieces can be measured, and the internal composition, structure, physical properties and state of materials or workpieces can be determined.
NDT can be applied to product design, material selection, processing and manufacturing, finished product inspection, in-service inspection (repair and maintenance), etc., and can play an optimal role between quality control and cost reduction. NDT also helps to ensure the safe operation and (or) effective use of products.
NDT includes many methods that can be effectively applied. The most commonly used NDT methods are: radiographic testing, ultrasonic testing, eddy current testing, magnetic particle testing, penetration testing, visual testing, leak detection, acoustic emission testing, radiographic testing, etc.
Since various NDT methods have their own scope of application and limitations, new NDT methods have been continuously developed and applied. Generally, as long as it meets the basic definition of NDT, any physical, chemical or other possible technical means may be developed into an NDT method.
In China, the term non-destructive testing was first called flaw detection or non-destructive testing, and its different methods were also called flaw detection, such as radiographic flaw detection, ultrasonic flaw detection, magnetic particle flaw detection, penetrant flaw detection, etc. This name or writing method is widely circulated and has been used to this day, and its usage rate is no less than that of the term non-destructive testing.
Abroad, the English word corresponding to the term non-destructive testing, except that the first half of the word, that is, non-destructive, is mostly written in the same way, the second half of the word is written differently. For example, Japan is used to writing inspection, many European countries used to write flaw detection, and now use testing uniformly. In addition to using testing, the United States seems to prefer writing examination and evaluation. When these words are combined with the first half, the abbreviations formed are NDI, NDT and NDE. When translated into Chinese, different terms and writing styles appear, such as non-destructive testing, non-destructive inspection (non-destructive inspection), non-destructive testing, non-destructive testing, and non-destructive evaluation. In fact, these different English and their corresponding Chinese terms have the same meaning and are synonyms. To this end, the International Organization for Standardization Technical Committee for Non-destructive Testing (ISO/TC 135) has developed and issued a new international standard (ISO/TS 18173:2005) to unify these terms in different forms and writing styles, making it clear that they are terms with the same definition and are synonyms, that is, they are all equivalent to non-destructive testing (non-destryctive testing). The different writing styles are only due to different language habits.
Therefore, as a standardized term, it is recommended to use the term "non-destructive testing", and the corresponding English term is recommended to use "Non-destructive testing". The name of various non-destructive testing methods also recommends the use of the word "testing", such as radiographic testing, ultrasonic testing, magnetic particle testing, penetration testing, eddy current testing, etc. When translating, it is recommended that English words such as inspection, examination, and evaluation used in conjunction with Non-destructive be translated into the word "non-destructive testing". Try to avoid writing "non-destructive flaw detection", "non-destructive inspection", "non-destructive testing", "non-destructive evaluation", etc. This translation method also applies to the translation of the names of various non-destructive testing methods.
Note: Words such as inspection, examination, and evaluation are only recommended to be translated into the word "testing" when translating the names of non-destructive testing and its methods. In other cases, it is advisable to translate according to the original content and Chinese habits.
English and abbreviations of commonly used NDT
methods: ultrasonic testing — UT
magnetic particle testing — MT
computed tomographic testing — CT
visual testing — VT
radiographic testing — RT
penetrant testing — PT
acoustic emission testing — AT, AE
eddy current testing — ET
leak testing — LT (end)
Reference address:What is Nondestructive Testing?
NDT refers to a method of testing materials or workpieces that does not damage or affect their future performance or use.
By using NDT, defects inside and on the surface of materials or workpieces can be found, the geometric features and dimensions of workpieces can be measured, and the internal composition, structure, physical properties and state of materials or workpieces can be determined.
NDT can be applied to product design, material selection, processing and manufacturing, finished product inspection, in-service inspection (repair and maintenance), etc., and can play an optimal role between quality control and cost reduction. NDT also helps to ensure the safe operation and (or) effective use of products.
NDT includes many methods that can be effectively applied. The most commonly used NDT methods are: radiographic testing, ultrasonic testing, eddy current testing, magnetic particle testing, penetration testing, visual testing, leak detection, acoustic emission testing, radiographic testing, etc.
Since various NDT methods have their own scope of application and limitations, new NDT methods have been continuously developed and applied. Generally, as long as it meets the basic definition of NDT, any physical, chemical or other possible technical means may be developed into an NDT method.
In China, the term non-destructive testing was first called flaw detection or non-destructive testing, and its different methods were also called flaw detection, such as radiographic flaw detection, ultrasonic flaw detection, magnetic particle flaw detection, penetrant flaw detection, etc. This name or writing method is widely circulated and has been used to this day, and its usage rate is no less than that of the term non-destructive testing.
Abroad, the English word corresponding to the term non-destructive testing, except that the first half of the word, that is, non-destructive, is mostly written in the same way, the second half of the word is written differently. For example, Japan is used to writing inspection, many European countries used to write flaw detection, and now use testing uniformly. In addition to using testing, the United States seems to prefer writing examination and evaluation. When these words are combined with the first half, the abbreviations formed are NDI, NDT and NDE. When translated into Chinese, different terms and writing styles appear, such as non-destructive testing, non-destructive inspection (non-destructive inspection), non-destructive testing, non-destructive testing, and non-destructive evaluation. In fact, these different English and their corresponding Chinese terms have the same meaning and are synonyms. To this end, the International Organization for Standardization Technical Committee for Non-destructive Testing (ISO/TC 135) has developed and issued a new international standard (ISO/TS 18173:2005) to unify these terms in different forms and writing styles, making it clear that they are terms with the same definition and are synonyms, that is, they are all equivalent to non-destructive testing (non-destryctive testing). The different writing styles are only due to different language habits.
Therefore, as a standardized term, it is recommended to use the term "non-destructive testing", and the corresponding English term is recommended to use "Non-destructive testing". The name of various non-destructive testing methods also recommends the use of the word "testing", such as radiographic testing, ultrasonic testing, magnetic particle testing, penetration testing, eddy current testing, etc. When translating, it is recommended that English words such as inspection, examination, and evaluation used in conjunction with Non-destructive be translated into the word "non-destructive testing". Try to avoid writing "non-destructive flaw detection", "non-destructive inspection", "non-destructive testing", "non-destructive evaluation", etc. This translation method also applies to the translation of the names of various non-destructive testing methods.
Note: Words such as inspection, examination, and evaluation are only recommended to be translated into the word "testing" when translating the names of non-destructive testing and its methods. In other cases, it is advisable to translate according to the original content and Chinese habits.
English and abbreviations of commonly used NDT
methods: ultrasonic testing — UT
magnetic particle testing — MT
computed tomographic testing — CT
visual testing — VT
radiographic testing — RT
penetrant testing — PT
acoustic emission testing — AT, AE
eddy current testing — ET
leak testing — LT (end)
Previous article:Leeb Hardness Tester Testing Principle and Measurement Analysis
Next article:Detection principles of several gas detection sensors
Recommended Content
Latest Test Measurement Articles
- New IsoVu™ Isolated Current Probes: Bringing a New Dimension to Current Measurements
- Modern manufacturing strategies drive continuous improvement in ICT online testing
- Methods for Correlation of Contact and Non-Contact Measurements
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
MoreSelected Circuit Diagrams
MorePopular Articles
- Intel promotes AI with multi-dimensional efforts in technology, application, and ecology
- ChinaJoy Qualcomm Snapdragon Theme Pavilion takes you to experience the new changes in digital entertainment in the 5G era
- Infineon's latest generation IGBT technology platform enables precise control of speed and position
- Two test methods for LED lighting life
- Don't Let Lightning Induced Surges Scare You
- Application of brushless motor controller ML4425/4426
- Easy identification of LED power supply quality
- World's first integrated photovoltaic solar system completed in Israel
- Sliding window mean filter for avr microcontroller AD conversion
- What does call mean in the detailed explanation of ABB robot programming instructions?
MoreDaily News
- STMicroelectronics discloses its 2027-2028 financial model and path to achieve its 2030 goals
- 2024 China Automotive Charging and Battery Swapping Ecosystem Conference held in Taiyuan
- State-owned enterprises team up to invest in solid-state battery giant
- The evolution of electronic and electrical architecture is accelerating
- The first! National Automotive Chip Quality Inspection Center established
- BYD releases self-developed automotive chip using 4nm process, with a running score of up to 1.15 million
- GEODNET launches GEO-PULSE, a car GPS navigation device
- Should Chinese car companies develop their own high-computing chips?
- Infineon and Siemens combine embedded automotive software platform with microcontrollers to provide the necessary functions for next-generation SDVs
- Continental launches invisible biometric sensor display to monitor passengers' vital signs
Guess you like
- Increase automotive design flexibility with slide switches
- Ping-Pong Operation
- Weekly review information is here~~
- LSM6DSOX evaluation board STEVAL-MKI197V1 data
- annysky2012's study record
- Smart door locks take the lead! Smart home entrance battlefield upgrades
- [EEWorld invites you to play disassembly] DIY a USB-PD decoy to turn the PD charger into a programmable DC power supply
- Cadence simulation steps.
- Bluetooth module selection problem
- Two-way and three-way