【Solution】｜R&S Optoelectronic Device Test Solution
Rohde & Schwarz (hereinafter referred to as "R&S") has long been exploring and accumulating experience in the field of optoelectronic components. The frequency domain parameter test solution and time domain parameter test solution launched by Rohde & Schwarz can help users quickly and reliably measure the frequency domain and time domain parameters of these optoelectronic components, helping users achieve efficient and high-quality R&D and production.
Frequency domain parameter testing application scenarios
E/E device measurement:
oE /E device measurements can be achieved using only a vector network analyzer. The measurement focus of E/E devices is mainly on transmission bandwidth, insertion loss or gain, impedance matching and group delay.
O/O device measurement :
oBefore testing optoelectronic devices, the vector network is typically calibrated at the end of the RF coaxial cable or probe. The bandwidth and group delay of the transmission system are usually tested. It can test the insertion loss of passive optical components, bandwidth limitations caused by dispersion effects, and optical group delay. In addition to basic vector network electrical interface calibration, O/O device testing also requires one-step optical fiber calibration. Calibrated E/O and O/E devices are connected to fiber optics. After normalized calibration, the error of the entire system can be eliminated.
E/O device measurements:
o EOM, DML or TOSA are the most common E/O devices. Dual-drive optical modulators can be characterized with a 4-port vector network analyzer such as the R&S®ZNA.
Frequency domain parameter test plan
The GOCA series general optoelectronic component analyzer is composed of a dedicated optoelectronic base and R&SZNA, ZNB and other series vector network analyzers. It can not only realize the parameter analysis of electrical components, but also enable users to analyze direct-modulated lasers, electro-optical modulators, photodetectors, Measurement of optoelectronic chips, devices and modules such as optical microrings and gratings, supporting the acquisition of key data such as S parameters, cutoff frequencies, differential/common mode parameters, delay parameters, intermodulation/intermodulation parameters, noise coefficients, etc., suitable for optoelectronics The entire cycle chain of component R&D, production and application.
Test system solution composition:
o
ZNA67 Microwave Vector Network Analyzer
o GOCA-67 photoelectric base
Solution advantages:
o Covers three types of optical device performance parameter testing: electro-optical, optical-electrical, optical-optical.
oMeasurement frequency up to 110 GHz
oMeasurement wavelength covers 1550nm / 1310nm / 850nm
Oscilloscope optical device time domain test solution
R&S and Newport Technology jointly launched an optical device test solution to help users quickly test the time domain parameters of optoelectronic components. Newport photodetectors work together with RTO6, RTP and other series oscilloscopes to integrate the measurement function of time domain parameters of optoelectronic components. It realizes the parameter analysis of laser components and also supports optoelectronic signal analysis, which can be used in the research and development, production and application of optoelectronic components.
The RTO6 oscilloscope series provides excellent signals to help you understand your application. This fully integrated test solution combines a large 15.6" touch screen, a new graphical user interface, best-in-class waveform capture rate, excellent signal fidelity, digital triggering, and fast-response deep memory for frequency, protocol, and logic analysis. The RTO6 oscilloscope series has a wealth of measurement tools and a new user interface to quickly solve a variety of simple or complex circuit problems.
Product Highlights:
oMaximum 6GHz bandwidth
oOne million waveforms per second
o 9.4ENOB, ensuring extraordinary signal integrity
oMaximum 2Gpoints storage depth
oUnique frequency region trigger
The RTP high-performance oscilloscope combines excellent signal integrity with waveform capture rate. It is compact, integrated with customized front-end ASIC and real-time processing hardware, and can perform accurate measurements at a whole new speed.
Product Highlights:
oWaveform capture rate up to 750,000 waveforms/second for quick troubleshooting
oHigh -precision digital triggering, no bandwidth limitations
oReal -time deembedding for triggering and fast waveform capture
oCompact design and quiet operation, suitable for any laboratory environment
o +/-0.25dB flat frequency response for accurate measurements
Rohde & Schwarz is a well-known supplier
in the fields of test and measurement, systems and solutions, networks and network security
.
The company has been established for more than 85 years and is headquartered in Munich, Germany, with subsidiaries in more than 70 countries around the world.
As an independent technology group, Rohde & Schwarz's innovative
products
and solutions provide a safer and more connected world for global industrial customers.
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