43 pages of excellent documents to answer all the questions you have had about probes over the years!

Faced with different application requirements and probes of different brands, there are often many problems in selecting and using probes. So how do engineers solve the many questions about probes?

1

An oscilloscope probe is a device or network that connects a signal source to an oscilloscope input. Whatever the probe actually is, it must provide a sufficiently convenient and high-quality connection between the signal source and the oscilloscope input. The probe is the bridge between the oscilloscope and the object being measured. Without this bridge, the oscilloscope cannot read the information of the object being measured.

2

The wide range of oscilloscope models and capabilities available is just one of the fundamental reasons for the large number of probes on the market. Different oscilloscopes require different probes. A 400 MHz oscilloscope requires a probe that supports 400 MHz bandwidth. However, many probes of the same functionality and cost will compete for a 100 MHz oscilloscope, so a different set of probes must be designed to support the 100 MHz bandwidth. In general, you should choose a probe that matches the bandwidth of the oscilloscope as closely as possible.

3

Due to the wide range of oscilloscope measurement applications and requirements, there are many oscilloscope probes available on the market, so the probe selection process can easily become confusing. To reduce a lot of confusion and narrow the selection process, it is very important to always follow the oscilloscope manufacturer's probe recommendations, which is very important because different oscilloscopes are designed for different bandwidth, rise time, sensitivity, and input impedance considerations. Fully utilizing the oscilloscope's measurement capabilities requires that the probe be matched to the oscilloscope's design considerations.

4

To obtain an oscilloscope display of a signal, some portion of the signal must be converted to the oscilloscope's input circuitry, where the circuitry behind the test point (TP) is represented by the signal source Es and the associated circuit impedances Zs1 and Zs2, which are the normal loads on Es. When the oscilloscope is connected to the test point, the probe impedance Zp and the oscilloscope input impedance Zi become part of the load on the signal source. Adding a probe and oscilloscope to the test point results in various loading effects, depending on the relative values ​​of the impedances.

5

Distortion (general specification) , Accuracy (general specification) , Ampere-second product (current probe) , Attenuation factor (general specification) , Bandwidth (general specification) , Capacitance (general specification) , CMRR (differential probe) , Decay time constant (current probe) , DC (current probe) , Frequency current derating (current probe) , Rise time (general specification) , Tangential noise (active probe) , Temperature range (general specification) , Threshold voltage (logic probe)

For more information about our products and applications, you can also contact us via the following methods:

Email: china.mktg@tektronix.com

Website: www.tek.com.cn

Tel: 400-820-5835 (Monday to Friday 9:00-17:00)