@Guangzhou Friends | 2016 Tektronix Test Tour Seminar is here

10:00~

10:40

Topic: Latest solutions for wireless connectivity and wireless signal analysis

Introduction: The development of wireless technology has made wireless systems more and more widely used, from large wireless systems such as the latest Internet of Things to small RF technology applications such as car wireless remote control keys (PKE), all of which reflect new applications of wireless technology. Traditional wireless signal test instruments are insufficient in dealing with these new applications. Tektronix's new RSA real-time signal analyzer series can fully cover these new technical test requirements. High-performance indicators, DPX real-time spectrum, innovative architecture, competitive price, and support for multiple standards, these distinctive features meet engineers' RF signal measurement and analysis requirements.

10:40~

10:50

10:50~

12:00

Topic : High-speed system bus interface and chip debugging solution

Discuss how to debug and verify the functions and performance of the input and output characteristics of RF/Power/Analog/digital/Optical ICs through Tektronix's product solutions, including the injection of stress such as jitter and noise through the generation of digital, analog, and RF modulation excitation signals, so as to verify the input tolerance of the chip, as well as the output quality analog characteristics verification of IC's RF, analog, and digital signals, digital demodulation, protocol decoding, and error analysis; multi-domain analysis in the time domain, frequency domain, and modulation domain, as well as multi-party observations of digital, analog, and RF. In addition, it will involve the consistency test verification of various low-speed and high-speed chip interface standards and the non-destructive failure analysis methods and cases when the chip is short-circuited, disconnected, or poorly soldered.

12:00~

13:30

13:30~

14:30

Topic: Sharing the latest semiconductor device testing technology and Keithley solutions

As an expandable semiconductor parameter test equipment, 4200 covers traditional device basic characteristic test, wafer test and parameter analysis, reliability test (WLR), and almost all the requirements of future new material power devices. This section will start with the theory of small signal test, summarize the common problems and test techniques in the test process, and provide corresponding solutions.

14:30~

14:45

14:45~

15:50

Topic: Mixed-Signal Testing for Next-Generation Wideband RF Technologies

Future broadband RF technology includes a lot of standard integration and new technologies. The demonstration, simulation and testing of these technologies and standards will rely heavily on modeling and semi-physical simulation and testing in the early stage. Tektronix's recently launched vector signal generator, arbitrary waveform generator, mixed domain oscilloscope and scalable broadband oscilloscope products, supplemented by RF components from third-party partners, can simply and completely support these semi-physical simulations and help test mixed signals of next-generation broadband RF technology.

15:50~

16:00