Here We Go! Tektronix invites you to participate in the 24th China International Optoelectronics Expo!
12.21
The 24th China International Optoelectronics Expo
As a comprehensive exhibition of the optoelectronic industry with great scale and influence, the 24th China International Optoelectronics Expo will be held at the Shenzhen International Convention and Exhibition Center from September 6 to 8, 2023!
Tektronix will bring its 400G/800G PAM4 actual test solution, 802.3ck photoelectric transmitter test solution, G.Metro test solution, 3D sensor test and optoelectronic device LIV characteristic analysis and other test solutions to the optical expo!
The exciting scene is about to begin...!
Here We Go!????
1
New generation optical sampling oscilloscope TSO820
2
DPO70000SX high performance real-time oscilloscope
Supports coherent light testing and NRZ/PAM4 signals simultaneously
Acquisition is critical in ultra-high bandwidth applications such as long-distance coherent optical communications, 400G data communications and wideband RF. The flagship DPO77002SX uses Tektronix's unique patented ATI (asynchronous timing interleaving) structure to achieve 70 GHz and 200GS/s (5ps/sample) real-time acquisition performance. The DPO70000SX provides the lowest noise, highest fidelity and maximum performance, supporting complex optical modulation analysis, jitter and noise analysis of high-speed serial signaling and frequency, and phase and modulation analysis of wideband RF signals.
3
400G/800G PAM4 actual test solution
- Supports 26GBd and 53GBd clock recovery
- Supports PAM4 and NRZ signal formats
-Only one clock synchronization line is needed, quickly compatible with other sampling oscilloscopes
4
802.3ck photoelectric transmitter test solution
Use DPO75902 oscilloscope + DPO70E optical probe to form a 53GBd PAM4 optical signal test solution.
Two DPO75902 oscilloscopes form a 53GBd PAM4 electrical signal test solution.
5
3D sensor testing and optoelectronic devices
LIV Characteristics Analysis Solution
■ Typical VCSEL device LIV test
■ Typical LIV test system
- SMU driven laser diode, measuring forward voltage
- Measure photodiode current via SMU, DMM or picoammeter
- Measure backside photodiode current via SMU, DMM or picoammeter
- Measure the temperature through the thermistor with a digital multimeter
More test plans are waiting for you to unlock,
We look forward to your visit for on-site technical exchanges!
Register to attend
Scan the QR code to register for the conference now!
Booth number:
Hall 10 10A89
Shenzhen International Convention and Exhibition Center (Baoan New Hall)
Click to read the original text and register to attend the conference now !
For more product and application details, you can also contact us through the following methods:
Email: china.mktg@tektronix.com
Website: tek.com.cn
Phone: 400-820-5835 (Monday to Friday 9:00-17:00)
Turn your inspiration into reality
We provide professional measurement insights designed to help you improve performance and turn possibilities into reality.
Tektronix Design and Manufacturing helps you test and measure solutions to break through layers of complexity and accelerate your global innovation. Working together, we will surely be able to help engineers at all levels create and realize technological progress more conveniently, quickly and accurately.
Scan the QR code to add "Tektronix Engineer Assistant"
Enjoy 1 to 1 exclusive service now!
Click "Read the original text" to register and attend the conference now!
京公网安备 11010802033920号