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MMDT5401

Description
Rated power: 200mW Collector current Ic: 200mA Collector-emitter breakdown voltage Vce: 150V Transistor type: 2 PNP (dual) Double PNP, Vceo=-150V, Ic=-0.2A
CategoryDiscrete semiconductor    The transistor   
File Size2MB,4 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/
Environmental Compliance

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

Download Datasheet Parametric View All

MMDT5401 Overview

Rated power: 200mW Collector current Ic: 200mA Collector-emitter breakdown voltage Vce: 150V Transistor type: 2 PNP (dual) Double PNP, Vceo=-150V, Ic=-0.2A

MMDT5401 Parametric

Parameter NameAttribute value
Is it Rohs certified?conform to
MakerJCET
package instruction,
Reach Compliance Codeunknown
Maximum collector current (IC)0.2 A
Minimum DC current gain (hFE)100
Maximum operating temperature150 °C
Polarity/channel typePNP
Maximum power dissipation(Abs)0.2 W
surface mountYES
Nominal transition frequency (fT)100 MHz

MMDT5401 Preview

Download Datasheet
JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOT-363 Plastic-Encapsulate Transistors
MMDT5401
FEATURES
Epitaxial Planar Die Construction
Complementary NPN Type Available(MMDT 5551)
Ideal for Medium Power Amplification and Switching
DUAL TRANSISTOR (PNP+PNP)
SOT-363
MRKING:K4M
MAXIMUM RATINGS (T
a
=25℃ unless otherwise noted)
Symbol
V
CBO
V
CEO
V
EBO
I
C
P
C
T
J
T
stg
Parameter
Collector- Base Voltage
Collector-Emitter Voltage
Emitter-Base Voltage
Collector Current -Continuous
Collector Power Dissipation
Junction Temperature
Storage Temperature
Value
-160
-150
-5
-0.2
0.2
150
-55-150
Units
V
V
V
A
W
ELECTRICAL CHARACTERISTICS (Ta= 25℃ unless otherwise specified)
Parameter
Collector-base breakdown voltage
Collector-emitter breakdown voltage
Emitter-base breakdown voltage
Collector cut-off current
Emitter cut-off current
DC current gain
Symbol
V
(BR)CBO
V
(BR)CEO
V
(BR)EBO
I
CBO
I
EBO
h
FE(1)
h
FE(2)
h
FE(3)
Collector-emitter saturation voltage
V
CE(sat)1
V
CE(sat)2
V
BE(sat)1
V
BE(sat)2
f
T
C
ob
NF
Test conditions
I
C
=-100μA ,
I
C
= -1mA ,
I
E
=-10μA,
I
E
=0
I
B
=0
I
C
=0
Min
-160
-150
-5
-0.05
-0.05
50
100
50
-0.2
-0.5
-1
-1
100
6
8.0
V
V
V
V
MHz
pF
dB
300
Typ
Max
Unit
V
V
V
μA
μA
V
CB
=-120 V , I
E
=0
V
EB
=-3V ,
V
CE
=-5 V,
V
CE
=-5 V,
V
CE
=-5 V,
I
C
=0
I
C
= -1mA
I
C
= -10mA
I
C
= -50mA
I
C
=-10 mA, I
B
=-1mA
I
C
=-50 mA, I
B
=-5mA
I
C
= -10 mA, I
B
=-1mA
I
C
= -50 mA, I
B
=-5mA
V
CE
= -10V, I
C
= -10mA,f = 100MHz
V
CB
=-10V, I
E
= 0,f=1MHz
V
CE
= -5.0V, I
C
= -200μA,
R
S
= 10Ω,f = 1.0kHz
Base-emitter saturation voltage
Transition frequency
Output Capacitance
Noise Figure
www.cj-elec.com
1
C,Jul,2015
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