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Is there a protocol for high-speed Serdes for Scan/Bist testing? [Copy link]

Is there a protocol for using high-speed Serdes for Scan/Bist testing? High-speed Serdes is used for data transmission, and low-speed Scan and other DFT tests are performed inside the chip. Is there such a protocol?
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@The boss is here to help  Details Published on 2018-7-4 10:48
 
 

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@The boss is here to help
This post is from Test/Measurement
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