NI Exclusive: All kinds of difficult testing problems are over!

eric_wang

NI Exclusive: All kinds of difficult testing problems are over! [Copy link]

Which of the challenges of electronic manufacturing production line testing touches your heart?

The product defect rate is 5-20%, the equipment utilization rate is only 40%, and the staff turnover rate is 15%. The production line change time is usually 2-3 hours. The introduction time of new products is relatively long, generally 2-6 months. The product defect rate is 5-20%, and the staff turnover rate is 15.

Based on these problems, how can we establish a strategy to solve them? NI experts have given some suggestions. I will first highlight the key points:

How to standardize testing and avoid being “ held hostage ” by suppliers

A customer survey by NI shows that test strategy is the aspect that the test team needs the most support, and standardization is one of the important keys to unlock the test strategy. Testing is not only a means to ensure product quality, but also can bring added value to the entire company.

If your company is also conducting test standardization, you may feel that the most common challenge is how to widely apply the results of standardization among multiple teams.

Even though the initial work was difficult, we were attracted by the huge potential of test standardization, such as accelerating the process of product launch, improving operational efficiency, ensuring product quality, reducing unplanned downtime of production lines, improving scalability, and improving reusability from R&D verification to production line testing.

In the live broadcast of the "Automation Roundtable", experts from NI partner Boceda showed the company's current test standardization achievements↓

How to maximize the value of data

We are not short of data, but we are short of methods to maximize the value of data. We can roughly divide the use of data by manufacturing companies into three levels: the first is to understand what has happened in the past; the second is to understand what is happening or will happen in the short term, which requires high real-time data collection and processing; the third is to let data provide insights for the entire cycle of the design and manufacturing process. (Friends can also expand on this)

Where can data analysis provide added value at various stages such as design, development, manufacturing, and operations?

• Data from design to production line testing is bidirectionally connected, and production line test data is imported into the simulation model in the R&D stage, thereby enhancing the guiding significance of test data for R&D, optimizing the design process, and improving the efficiency of the design verification stage.

• Optimize test strategies by reusing IP and data from the development phase, spanning the development to manufacturing process.

• By integrating test data from design to production, we can accelerate the response to problems that arise in production through root cause analysis, thereby optimizing or reducing test steps and reducing unplanned downtime through predictive maintenance.

Test teams around the world are in urgent need of a comprehensive test strategy to balance these requirements, and they have chosen the NI test platform because of its complete software solutions and modular hardware architecture.

Here we introduce the concept of a test station, which includes four basic elements: hardware infrastructure, hardware instruments, local software, and server/cloud software.

What is the strong backing for these strategies?

PXI can be said to be the soul of NI's modular test platform. NI provides more than 600 PXI modules, covering a frequency range from DC to millimeter wave. The information comes from the Electronic Functional Test Solutions Handbook.

The above information is excerpted from the NI electronic test information collection, which also includes information about the current hot issue of digital transformation, as well as basic and important instrument selection issues. You can check it out yourself.

The editor divides the information into several types for reference~

Don’t miss out on this great information, download it now

NI Electronic Test Data Collection