[AT-START-F403A Evaluation] Part 3 freeRTOS system based on IAR environment external QSPI flash (SPIM) EN25QH...
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This post was last edited by uuxz99 on 2020-10-5 16:54
The AT-START-F403A evaluation board is equipped with an external 16M-byte NOR QSPI Flash ( EN25QH128A ) . The large enough capacity and speed are suitable for many applications. A simple test was done in the freeRTOS environment. Due to the simple test environment, the results may be erroneous and are for reference only.
1.SPIM initialization:
- 1.1 Port Initialization
1.2SPIM configuration flash
- Configure external flash device class type
- No encryption setting
- Test sample settings
2. SPIM test :
This test is a test in a complete application environment, not a completeness indicator test. The test task (thread) starts a test cycle every second, with 8 sectors (4K) in each cycle. Each test process is to erase the sector -> write word by word (write 4 bytes until the sector is full) -> read the sector -> verify. Since the external flash is operating at 104MHz, the AHB is reduced to 200MHz so that the external flash can operate at the best performance.
2.1 SPIM write test method:
Write 4K sample data to calculate the time required to complete the write. Data is written as 4 bytes, and the entire write time includes the following
- Sector erase time.
- Sector programming time.
- Flash status control and other time.
2.2 SPIM reading test method:
The time required to read the 4K sample data just written. Reading is based on a 4-byte read operation, and the entire read time is as follows:
- Check external flash status before reading
- Read the data.
3. SPIM rough test results
3.1 It should be noted that the page in the firmware library-related SPIM function operation naming FLASH_ErasePage is a different concept from the device page. The device manual states that the page cannot be erased, but can be programmed. The function page corresponds to the device sector, and the firmware operation is based on sector 4K. You may need to pay attention to this during use.
3.2 Test Results
The test results are shown in the figure below.
3.3 Test result description
3.3.1 Sector write time is about 50-60ms, of which sector erase time accounts for more than 80%, programming write time is about 8ms, and the rest time is about 1-3ms for system status query,Control and test itself and information printing and other overhead.
3.3.2 Sector read speed is about 1 millisecond or less
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