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Can the 66AK2L06 SoC enable miniaturization of test and measurement equipment? [Copy link]

     All electronic products have their design, development and production processes closely related to their test and measurement equipment? For all electronic products, the purpose of test and measurement equipment is the same - to ensure product quality and reliability. It is with this equipment that electronic products have become an indispensable part of our lives. Currently, almost every industry, from consumer electronics, enterprise and telecommunications, to aerospace and defense, industrial and medical, uses test and measurement equipment to verify quality and reliability. The test and measurement equipment industry needs to develop faster, making its test and measurement equipment stronger than electronic products in terms of functionality and always leading in technology. According to TechNavio's Global Test and Measurement Equipment Market 2011-2015 report, test and measurement equipment manufacturers are working towards minimization. Minimization will maximize portability while minimizing production costs. During the deployment stage, electronic products will rely on portable and handheld test and measurement equipment for field testing. This trend has also led technology suppliers to use different methods to support the trend of minimization. One of such solutions is TI's recently released DSP+ARM System on Chip (SoC) - 66AK2L06. The 66AK2L06 SoC is based on the KeyStone II architecture with four C66x DSPs and two ARM Cortex-A15 cores. The SoC integrates a software-programmable digital front end (DFE) for sample rate conversion and digital filtering, as well as a JESD204B interface for seamless connection with TI's high-speed data converters (ADC/DAC). In addition, the SoC provides FFT performance of up to 46MFFT/s and 84dB SNR using an integrated Fast Fourier Transform Coprocessor (FFTC) hardware accelerator. The 66AK2L06 SoC provides a rich hardware environment and a complete software environment to achieve single-chip processing from sampling (JESD204B) to results (Ethernet/PICe/USB). The SoC meets the advanced measurement and high-precision requirements of test and measurement applications with a flexible and high-performance platform. For example, implementing a spectrum analyzer on a 66AK2L06 SoC would involve DFE to perform sample-level processing, FFTC hardware accelerator to perform frame-level processing, and a multicore software development kit (MCSDK), along with DSPLib to support block-level processing on the C66x DSP cores. The 66AK2L06 SoC capabilities enable a spectrum analyzer to perform real-time comparisons between frequency and power and phase measurements. The increased integration, programmability, and flexibility provided by the 66AK2L06 SoC give users significant advantages—C-SWaP (cost, size, weight, and power) efficiencies, as well as faster time to market. The combination of DFE and JESD204B eliminates the need for expensive FPGA/ASICs, further reducing board space. In recognition of TI's efforts in this area, TI was awarded the 2015 Enabling Technology Award by Frost & Sullivan for the 66AK2L06 SoC. After evaluating TI's 66AK2L06 SoC based on two key factors, namely technology leverage and user influence, Frost & Sullivan believes that TI's 66AK2L06 SoC is ahead of competing products. The 66AK2L06 SoC targets a variety of applications, including avionics, defense, radar, medical, sonar, and especially signal generators, spectrum analyzers, signal analyzers, oscilloscopes and telecommunications test equipment in the test and measurement market. Starting to develop the next generation of test and measurement equipment? You can get a head start by using a system reference design that has been pre-validated with the 66AK2L06 and wideband ADC12J4000 and DAC38J84 data converters.
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