The EVALSTGAP2SICD is an half bridge evaluation board designed to evaluate the STGAP2SiCD isolated dual gate driver. The gate driver is characterized by 4 A current capability and rail-to-rail outputs, making the device suitable also for high power applications such as motor drivers in industrial applications equipped with SiC power switches.
The device integrates protection functions: dedicated SD and BRAKE pins are available, UVLO and thermal shutdown are included to easily design high reliability systems, and the interlocking function prevents outputs from being high at the same time.
The device allows implementing negative gate driving, and the on-board isolated DC-DC converters allows working with optimized driving voltage for SiC MOSFETs.
The EVALSTGAP2SICD board allows evaluating all the STGAP2SICD features while driving a half-bridge power stage with voltage rating up to 1200 V in TO-220 or TO-247 package.
The board allows easily selecting and modifying the values of relevant external components in order to ease driver performance evaluation under different applicative conditions and fine pre-tuning of final application components.
所有功能
Board
High voltage rail up to 1200 V
Negative gate driving
On-board isolated DC-DC converters to supply high-side and low-side gate drivers, fed by VAUX = 5 V, with 5.2 kV maximum isolation
VDD logic supplied by on-board generated 3.3 V or VAUX = 5V
Easy jumper selection of driving voltage configuration: +17/0 V; +17/-3 V; +19/0 V; +19/-3 V;
Device
Driver current capability: 4 A source/sink @ 25°C
4 A Miller CLAMP
Short propagation delay: 75 ns
UVLO function
Configurable interlocking function
Dedicated SD and BRAKE pins
Gate driving voltage up to 26 V
3.3 V, 5 V TTL/CMOS inputs with hysteresis
Temperature shutdown protection
Standby function
Devices | Class | introduce | Datasheet |
---|---|---|---|
STGAP2SICD | Galvanically isolated 4 A dual gate driver | Download |
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