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Location:Training / Tools/EDA / Very Large Scale Integrated Circuit Testing (VLSI Testing) / DFT1 Muxed_D Scan ATPG model (_optional)

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DFT1 Muxed_D Scan ATPG model (_optional)
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Duration：28 minutes and 19 seconds
Date：2021/06/24

Uploader：桂花蒸

Introduction

keywords： test integrated circuit BIST

This course is offered by Prof. James Chien-Mo Li, Lab of Dependable Systems, National Taiwan University.
Lecture notes available on course website http://cc.ee.ntu.edu.tw/~cmli/VLSItes...
This course is based on the teaching materials of late Professor McCluskey, Stanford University

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