Power loss is an important part of the performance evaluation of switching devices and is also an advanced function that many oscilloscopes offer as optional extras. Although many laboratories are equipped with a power loss measurement environment and have invested a lot in equipment and probes, if engineers ignore the time offset between probes, the test results may become meaningless.
1. What issues should be considered in switching loss measurement
In the actual measurement and evaluation, we use one channel to measure voltage and another channel to measure current. The software then multiplies them to obtain the power curve and then integrates them over the time interval to obtain the final result.
Two points to note:
Ensure that the bandwidth of the oscilloscope and probe is sufficient to accurately obtain the waveform of the switching device during the opening and closing process;
Accurately measure the phase to ensure the correspondence between voltage and current.
It is easy to understand that the bandwidth is sufficient, but how can we ensure the correspondence between voltage and current?
2. Impact of time offset on measurement results
When there is a time offset between the voltage channel and the current channel, the measurement result is obviously too high or too low, and the faster the switching speed of the device, the more obvious the impact of the offset. Figure 1 is a schematic diagram of the MOS tube turn-off loss measurement. It can be seen that only after correction can the correct measurement result be obtained. It is worth noting that this offset is common due to the differences in the implementation principles of voltage probes and current probes and the length of the probe transmission cable.
Figure 1. The impact of channel offset on measurement results
3. How to correct channel offset
As shown in Figure 2, the offset correction fixture can directly correct the time offset between the voltage probe and the current probe. The basic principle is that the fixture generates a set of voltage and current pulse signals with zero phase difference and acts on the voltage and current probes at the same time. The time offset of the pulse signal after passing through the probe is observed through an oscilloscope, and the offset time is corrected on the oscilloscope.
The fixture is powered by a USB port and is easy to use. The time offset correction can be done manually or automatically. Using the offset correction fixture, the waveforms before and after correction are shown in Figures 3 and 4, respectively.
Figure 2 ZDF1000 offset correction fixture
Figure 3 Waveform before offset correction
Figure 4 Waveform after offset correction
4. The impact of extension lines on transmission delay
In addition to performing offset correction, in actual measurements, attention should also be paid to the influence of extension cords. A typical test diagram is shown in Figure 5. Since current clamps usually cannot measure current directly on the PCB board, the current needs to be led out through extension cords. Extension cords will introduce transmission delays. Ordinary copper extension cords can be calculated at 33.5ps/cm and compensated for by the delay correction parameters of the oscilloscope.
Similarly, the extension line of the voltage probe will also cause transmission delay, which can be compensated by adjusting the delay correction parameters according to the lead-lag relationship in the actual measurement. Taking Figure 5 as an example, assuming that the length of the extension line is 100cm, the delay time of the current channel is: 33.5ps/cm×100cm=3.35ns. After the offset correction fixture is used to complete the correction, the delay correction time of the current channel should be adjusted to be 3.35ns ahead of the voltage channel.
Figure 5 Typical test diagram
V. Conclusion
From the above analysis, we can see that when using an oscilloscope to measure switching loss, in addition to ensuring accurate waveform measurement, we must also pay attention to the time offset between channels. This time offset introduced by the probe will introduce a large error to the measurement itself. Therefore, when accurately evaluating power loss, it is necessary to use an offset correction fixture to correct the channel delay.
Previous article:How to design a digital oscilloscope with stm32 as the control core?
Next article:Software Design of Virtual Digital Storage Oscilloscope Based on PXI Bus
- Popular Resources
- Popular amplifiers
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
- LED chemical incompatibility test to see which chemicals LEDs can be used with
- Application of ARM9 hardware coprocessor on WinCE embedded motherboard
- What are the key points for selecting rotor flowmeter?
- LM317 high power charger circuit
- A brief analysis of Embest's application and development of embedded medical devices
- Single-phase RC protection circuit
- stm32 PVD programmable voltage monitor
- Introduction and measurement of edge trigger and level trigger of 51 single chip microcomputer
- Improved design of Linux system software shell protection technology
- What to do if the ABB robot protection device stops
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Innovation is not limited to Meizhi, Welling will appear at the 2024 China Home Appliance Technology Conference
- Huawei's Strategic Department Director Gai Gang: The cumulative installed base of open source Euler operating system exceeds 10 million sets
- Download from the Internet--ARM Getting Started Notes
- Learn ARM development(22)
- Learn ARM development(21)
- Learn ARM development(20)
- Learn ARM development(19)
- Learn ARM development(14)
- The principle of phase-locked loop frequency control
- [AutoChips AC7801x motor demo board evaluation] Development environment construction
- Arteli AT32F413 to AT32F415 Migration Guide_V1.0.0
- How to select components in the box?
- Showing off the i.MX6 development board
- [Xianji HPM6750 Review 10] Drawing a multi-function expansion board and verification
- About the distance of infrared obstacle avoidance circuit
- Repost - Tesla battery violent disassembly video
- Relationship between transformer and inductor
- How to port uCOS-II to LPC17XX