2600-PCT-x/4200-PCT-x Parametric Curve Tracer Configuration

Configurable power levels:

– From 200V to 3kV

– From 1A to 100A

• Wide dynamic range:

– From μV to 3kV

– From fA to 100A

• Capacitance-voltage method:

– ±400V multi-frequency CV

– 200V ramp rate CV

– 20V Very Low Frequency (VLF) CV

• DC or pulse IV, 50μs minimum

• High voltage and high current channels with 24-bit high-precision A/D converter and 18-bit high-speed (1μs) digitizer

• Test management software, including trace mode (for real-time control) and parameter mode (for parameter extraction)

application

• Power semiconductor device characteristics analysis and testing

• GaN, SiC, LDMOS and other device characteristics analysis

• Power device reliability research

• Device testing and quality certification

High Power Device Characterization

Today, the characterization and testing of high-power semiconductor devices and components places a high demand on test equipment. Device design engineers need equipment to support the entire life cycle of power devices. Currently, there are two main ways to use high-power characterization systems - full turnkey systems and building blocks that must be configured by the user through software. Turnkey systems can be set up and run immediately, but these systems can be very expensive and have limited scope of use.

Keithley's parametric curve tracer configuration is a complete solution that comes with a variety of high-quality instruments, cables, test fixtures, and software. This building block approach has the advantage of being easy to upgrade or change to meet changing test needs. For example, a user may initially purchase a low-cost 200V/10A system, which can easily be expanded to 50A or 100A capacity. In addition, these instruments and accessories can be used between different test system platforms, such as reliability or device certification testing.

Keithley's parameter curve tracer configuration includes everything a characterization engineer needs to quickly develop a complete test system. The ACS Basic software provides complete device characterization, including: real-time tracking mode for rapid detection of key device parameters (such as breakdown voltage); full parameter mode for extracting high-precision device parameters. The ACS Basic software can provide a variety of sample device knowledge bases, which are not available in traditional curve tracers. More importantly, users have full control over all test sources, enabling them to create more advanced tests than ever before.