The stylus and ball are the key link between the sensor of the coordinate measuring machine (CMM) and the surface of the workpiece being measured. If the inappropriate stylus and ball are selected for a specific measurement task, it may lead to uncertainty and inconsistency in the measurement results. In order to optimize the measurement accuracy of the CMM, careful consideration must be given when selecting the stylus and ball. Renishaw, a British measurement product manufacturer, introduced the impact of the selection of stylus and ball on the overall measurement accuracy of the CMM from four aspects. (1) Roundness of the stylus ball: The stylus ball at the top of the stylus of most CMM stylus bars is an artificial ruby ball. The roundness error of the stylus ball may cause the CMM to lose up to 10% of its potential measurement accuracy. The manufacturing accuracy level of ruby stylus balls is defined by grades, and the grade of a stylus ball is determined by its maximum deviation from an ideal sphere. The two most commonly used stylus ball grades are grade 5 and grade 10 (with sphericity errors of 0.13µm and 0.25µm respectively). Although some cost savings can be achieved by switching from a Grade 5 to a Grade 10 ball, the generally accepted 5:1 ratio of CMM measurement uncertainty to form tolerance may be jeopardized. Although a standard Grade 5 ball may cost slightly more, this cost is negligible compared to the possibility of scrapping a good part or allowing a bad part to pass. (2) Material of the stylus ball: Although ruby is the most commonly used stylus ball material, other materials may be more suitable for contact scanning measurement. During scanning measurement, the stylus ball slides along the surface of the workpiece, causing friction and wear. In extreme cases, this long-term contact may cause the stylus ball material to be removed from the ball (abrasive wear) or the workpiece material to adhere to the stylus ball (adhesive wear). In either case, the roundness of the stylus ball will be affected. When a part of the stylus ball is in constant contact with the workpiece, this roundness error will continue to increase. Abrasive wear may occur when scanning the surface of certain materials (such as cast iron). Tiny particles left behind can cause minor scratches on the ball and workpiece surfaces, creating a tiny "flat" on the ball. For this type of measurement, a harder zirconium oxide ball is a good choice. Adhesive wear usually occurs when the ball material has a chemical affinity with the workpiece material, which is common when scanning aluminum with a synthetic ruby ball, which is primarily composed of aluminum oxide. Material transferred from the relatively soft aluminum to the ball can form a "coating" that reduces the roundness accuracy of the ball. In this case, a silicon nitride ball is a better choice because it has good wear resistance and no affinity for aluminum. (3) Stem deflection: Measurement accuracy decreases with increasing stem length, so long stems are not suitable for measuring all workpiece features (in fact, it is correct to use a stem that is as short as possible with maximum stiffness). Although the stem does not directly cause this specific error, the stem length can amplify the error. This error occurs when the probe contacts the workpiece from different directions, causing changes in pre-travel due to different measurement forces required to trigger. Calibrating the probe with a standard circle can reduce this pre-travel error, but it cannot completely eliminate it. The flexibility of the probe stem will amplify changes in pre-travel. Although steel is also suitable for manufacturing some short probes, carbide is the most rigid probe material. However, due to its high density, carbide is not suitable for long probes. Ceramic probes are generally used for measurement tasks that require both good rigidity and light weight. Similarly, carbon fiber is also generally used to manufacture very long probes. (3) Thermal stability: Temperature fluctuations can cause large CMM measurement errors. Selecting the appropriate extension rod material can achieve better stability and provide more consistent measurement results when environmental conditions change. Materials with low thermal expansion coefficients are the preferred probe rod materials (especially when using long probes) because the amount of thermal expansion depends on the length. Carbon fiber is the most commonly used material for long probes and extension rods because it is both rigid and light. Titanium alloys have good strength, stability and density, making them very suitable for manufacturing metal parts of probe rods (such as joints and movable joints). (end) |
Previous article:Testing indicators and methods for diamond circular saw blade substrate
Next article:Inspection of micro milling cutters can cut tool costs in half
- Popular Resources
- Popular amplifiers
Recommended Content
Latest Test Measurement Articles
- Keysight Technologies Helps Samsung Electronics Successfully Validate FiRa® 2.0 Safe Distance Measurement Test Case
- From probes to power supplies, Tektronix is leading the way in comprehensive innovation in power electronics testing
- Seizing the Opportunities in the Chinese Application Market: NI's Challenges and Answers
- Tektronix Launches Breakthrough Power Measurement Tools to Accelerate Innovation as Global Electrification Accelerates
- Not all oscilloscopes are created equal: Why ADCs and low noise floor matter
- Enable TekHSI high-speed interface function to accelerate the remote transmission of waveform data
- How to measure the quality of soft start thyristor
- How to use a multimeter to judge whether a soft starter is good or bad
- What are the advantages and disadvantages of non-contact temperature sensors?
MoreSelected Circuit Diagrams
MorePopular Articles
- Innolux's intelligent steer-by-wire solution makes cars smarter and safer
- 8051 MCU - Parity Check
- How to efficiently balance the sensitivity of tactile sensing interfaces
- What should I do if the servo motor shakes? What causes the servo motor to shake quickly?
- 【Brushless Motor】Analysis of three-phase BLDC motor and sharing of two popular development boards
- Midea Industrial Technology's subsidiaries Clou Electronics and Hekang New Energy jointly appeared at the Munich Battery Energy Storage Exhibition and Solar Energy Exhibition
- Guoxin Sichen | Application of ferroelectric memory PB85RS2MC in power battery management, with a capacity of 2M
- Analysis of common faults of frequency converter
- In a head-on competition with Qualcomm, what kind of cockpit products has Intel come up with?
- Dalian Rongke's all-vanadium liquid flow battery energy storage equipment industrialization project has entered the sprint stage before production
MoreDaily News
- Allegro MicroSystems Introduces Advanced Magnetic and Inductive Position Sensing Solutions at Electronica 2024
- Car key in the left hand, liveness detection radar in the right hand, UWB is imperative for cars!
- After a decade of rapid development, domestic CIS has entered the market
- Aegis Dagger Battery + Thor EM-i Super Hybrid, Geely New Energy has thrown out two "king bombs"
- A brief discussion on functional safety - fault, error, and failure
- In the smart car 2.0 cycle, these core industry chains are facing major opportunities!
- The United States and Japan are developing new batteries. CATL faces challenges? How should China's new energy battery industry respond?
- Murata launches high-precision 6-axis inertial sensor for automobiles
- Ford patents pre-charge alarm to help save costs and respond to emergencies
- New real-time microcontroller system from Texas Instruments enables smarter processing in automotive and industrial applications
Guess you like
- Share the correct use and maintenance guide of NiMH batteries
- EEWORLD University Hall----Live Replay: The Latest Isolation Devices Compliant with USB 2.0 Standards
- EEWORLD University - Understanding PID Control (English subtitles)
- IAR Compilation Optimization Level Introduction
- Problem with peripheral clock enable statement
- Choosing the right ARM-based MCU
- EEprom write speed is slow
- They are all six non-gates. This power supply can be used even if it is connected reversely, but it cannot be replaced.
- About the test of power supply Wenbo
- EEWORLD University - Understand the basic technology of power density