Jitter in the sampling clocks of analog-to-digital and digital-to-analog converters limits the maximum achievable signal-to-noise ratio (see van de Plassche, Integrated Analog-to-Digital and Digital-to-Analog Converters, in the References section). This application note defines phase noise and jitter, plots their power spectral densities, describes time-domain and frequency-domain measurement techniques, explains the disadvantages of laboratory equipment, and provides correction factors for these techniques. The theory presented is supported by experimental results and can be applied to solve real-world problems.
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