LTE base station bit error rate test is one of the most critical test items in base station RF test. A fast and efficient test method and test architecture are proposed. This solution uses the base station RF board as a data acquisition card to complete the demodulation of the uplink and the conversion of analog signals into I/Q data. ADS and MATLAB are used to build the synchronization and decoding functions of the uplink channel. Tests show that the test accuracy of this solution reaches 0.2dB, which fully meets the functional requirements of testing uplink-related RF indicators in R&D and production. At the same time, this design also has a short development cycle, low investment cost, simple operation, and strong cross-system transplantation capabilities.
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