Compared with other memories, SDRAM has the advantages of fast speed, large capacity, low price and high integration; however, SDRAM testing is a big problem. In view of the current situation that domestic users have difficulty in testing this type of integrated circuit, this paper aims to study SDRAM and related testing theories, and takes H Y57V281620 as an example to realize the development of SDRAM test program on domestic ATE. Through verification, this method can well solve the long-standing problem of difficult SDRAM storage testing.
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