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Step Stress Accelerated Life Test of High Power Transistors

  • 2013-09-22
  • 778.39KB
  • Points it Requires : 1

Accelerated life tests are widely used to predict the life of components in a short time. This paper introduces the use of step stress accelerated life tests to estimate the activation energy and life of high-power transistors. This test uses a temperature ramp model, and the test results are considered reasonable after comparison with empirical data.

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