With the rapid development of electronic technology, the complexity of circuit systems has increased dramatically. More and more circuits contain both digital and analog signals, making the testing of circuit systems more and more difficult. Circuit testing is therefore facing greater challenges. The current circuit fault methods are mainly aimed at digital circuits and analog circuits, but the testing of mixed digital and analog circuits is still a very young field. In view of the current status of mixed digital and analog circuit testing, the basic ideas of various fault diagnosis methods are introduced. The focus is on the fault diagnosis of mixed digital and analog circuits based on DES theory.
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