XE64S-N14-0.450MHZ datasheet, PDF

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XE64S-N14-0.450MHZ: DescriptionACMOS Output Clock Oscillator, 0.45MHz Nom, CMOS, J-LEADED, SMD, 4 PIN; CategoryPassive components oscillator; File Size78KB，9 Pages; ManufacturerXsis Electronics Inc.

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XE64S-N14-0.450MHZ Overview

ACMOS Output Clock Oscillator, 0.45MHz Nom, CMOS, J-LEADED, SMD, 4 PIN

XE64S-N14-0.450MHZ Parametric

Parameter Name	Attribute value
Objectid	145060423031
package instruction	SMDIP4,.23,200
Reach Compliance Code	compliant
maximum descent time	5 ns
Frequency Adjustment - Mechanical	NO
frequency stability	1000%
Installation features	SURFACE MOUNT
Number of terminals	4
Nominal operating frequency	0.45 MHz
Maximum operating temperature	105 °C
Minimum operating temperature	-55 °C
Oscillator type	ACMOS
Output load	10 KOHM, 15 pF
Package body material	CERAMIC
Encapsulate equivalent code	SMDIP4,.23,200
physical size	8.89mm x 7.4mm x 4.06mm
longest rise time	5 ns
Maximum slew rate	2.5 mA
Maximum supply voltage	2.75 V
Minimum supply voltage	2.25 V
Nominal supply voltage	2.5 V
surface mount	YES
maximum symmetry	55/45 %
technology	CMOS

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REV LTR

DESCRIPTION

Updated per ECN 2013-20

Updated per ECN 2016-6

DATE

10/25/13

12/15/16

APPVD.

MLG

XSIS XE64S – N00, SERIES

HC/ACMOS OSCILLATORS

FOR SPACE APPLICATIONS

450 KHz to 120 MHz

( 7 x 9 mm, J-Leads, SMD, 2.5V )

(

Refer to Page 5 for Models with Reduced Screening & QCI )

REV STATUS

OF SHEETS

APPROVALS

PREP.

ENG.

Q. A.

S. Gupta

REV

SHEET NO.

DATE

1/25/12

9 10 11 12 13 14 15 16

XSIS ELECTRONICS, INC.

12620 W. 63

Street, Shawnee, KS 66216 USA

M. Gupta

XE64S - N00 SERIES HC/ACMOS

“S” LEVEL OSCILLATORS

FSC NO.

57051

SCALE

N/A

SHEET

DWG. NO.

CUST.

ENG.

CUST

Q A.

XE64S-N00

1 OF 3

3.7.3 Passive Elements: Established Reliability (ER) QPL components, failure level R minimum shall

be used or element lot evaluation shall be as per MIL-PRF-55310, class S, or MIL-PRF-38534,

Appendix C, Class K as applicable.

3.7.4 Microcircuit die shall be from lots that have passed the element evaluation per MIL-PRF-55310,

Appendix B, Level S, except testing per Subgroup 5 is omitted. Subgroup 5 testing is circuit

configuration dependent, therefore, it is more effectively performed at the oscillator level as

explained in Paragraph 3.7.5 herein.

3.7.5 For Output Frequency up to 70 MHz, Microcircuit die used in the oscillator shall be from NSC/FC

54ACT family and must be from wafer lot that has been successfully tested in the oscillator for

ionizing radiation of up to100 krads Xsis Electronics has also performed SET & SEL testing on the

microcircuit die. Test reports are available on request. For output frequencies above 70 MHz, the

microcircuit die shall be from 0.8 µm BiCMOS Si family and must be from wafer lots that have been

successfully tested in the oscillator for ionizing radiation of up to 100Krads and is known to be

Single Event Latch-up immune for LET of up to 95 Mev-cm /mg.

3.7.6 Workmanship, Rework and Process controls shall be in accordance with the requirements of

MIL-PRF-55310.

3.7.7 Lot Traceability: Production lot for these oscillators shall be homogenous. Each element used in

the production lot shall be traceable to a single lot. Swept quartz shall be traceable to the quartz

bar, and its applicable processing details.

Quality Assurance Provisions: The quality assurance provisions shall be per MIL-PRF-55310,

except as specified herein.

100% Screening: The 100% screening shall be performed as per Table II. PDA requirements for

nondestructive bond pull and burn-in shall be as specified below.

PDA for Nondestruct Bond Pull: Unless otherwise specified, PDA shall be 2% of total number of

wires or 1 wire whichever is greater.

PDA for Burn-in: Unless otherwise specified, PDA for burn-in shall be 2% or 1 oscillator whichever

is greater and shall be applicable to +23 C and/or +25 C static tests only. In addition Delta

Calculation shall be performed after Burn-in and shall count for PDA. All measured values for

Delta Calculation shall be recorded. Parts that exceed the specified delta limits shall be rejected and

be counted for PDA. Delta Calculation shall be performed at 2.5 VDC for the following parameters:

Input Current

Output High Level

Output Low Level

10% change Maximum

0.1V change Maximum

4.1

4.2

4.3

4.4

4.5

Group A inspection shall be in accordance with MIL-PRF-55310 for product level S.

Group B inspection ( 30 day aging ) shall be in accordance with MIL-PRF-55310 for product level S.

In order to expedite delivery, by customer request, the aging test can be ended after 15 days if the

amount of frequency aging is less than 50% of the 30 day specification limit.

Oscillators shall be capable of meeting group C inspection per MIL-PRF-55310. Generic group C

inspection data on similar parts may be used to satisfy this requirement. When specified by the

Customer, Xsis Electronics will perform Group C testing at an additional charge.

4.6

XSIS ELECTRONICS, INC.

12620 W. 63

FSC NO.

USA

DWG. NO.

REV

St., Shawnee, KS 66216

57051

SCALE

N/A

XE64S-N00

SHEET

3 OF 9

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