XE63P-A12-24.000MHZ datasheet, PDF

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XE63P-A12-24.000MHZ: DescriptionACMOS Output Clock Oscillator, 24MHz Nom, SMD, 4 PIN; CategoryPassive components oscillator; File Size76KB，6 Pages; ManufacturerXsis Electronics Inc.

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XE63P-A12-24.000MHZ Overview

ACMOS Output Clock Oscillator, 24MHz Nom, SMD, 4 PIN

XE63P-A12-24.000MHZ Parametric

Parameter Name	Attribute value
Objectid	1321705777
Reach Compliance Code	compliant
maximum descent time	5 ns
Frequency Adjustment - Mechanical	NO
frequency stability	1000%
Installation features	SURFACE MOUNT
Number of terminals	4
Nominal operating frequency	24 MHz
Maximum operating temperature	85 °C
Minimum operating temperature	-30 °C
Oscillator type	ACMOS
Output load	10 KOHM, 15 pF
physical size	14.1mm x 9.53mm x 3.81mm
longest rise time	5 ns
Maximum supply voltage	5.5 V
Minimum supply voltage	4.5 V
Nominal supply voltage	5 V
surface mount	YES
maximum symmetry	55/45 %

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REV LTR

DESCRIPTION

DATE

APPVD.

Revised Scope. Updated frequency range. Revised

paragraphs related to Hybrid Elements. Changed

frequency Vs. supply voltage specification.

Updated per ECN 2012-5

Updated per ECN 2012-22

10/21/10

MLG

12/15/11

8/15/12

MLG

XSIS XE63S - A00, SERIES

HC/ACMOS OSCILLATORS

FOR SPACE APPLICATIONS

400 KHz to 90 MHz

( 9 x 14 mm SMD, 5.0V )

REV STATUS

OF SHEETS

APPROVALS

PREP.

S. Gupta

ENG.

M. Gupta

Q. A.

M. Gupta

CUST.

ENG.

CUST

Q A.

REV

SHEET NO.

DATE

8/10/10

9 10 11 12 13 14 15 16

XSIS ELECTRONICS, INC.

12620 W. 63

Street, Shawnee, KS 66216 USA

XE63S - A00 SERIES HC/ACMOS

“S” LEVEL OSCILLATORS

FSC NO.

57051

SCALE

N/A

SHEET

DWG. NO.

XE63S-A00

1 OF 6

3.7.3

Microcircuit die shall be from lots that have passed the element evaluation per MIL-PRF-55310,

Appendix B, Level S, except testing per Subgroup 5 is omitted. Subgroup 5 testing is circuit

configuration dependent, therefore, it is more effectively performed at the oscillator level as

explained in Paragraph 3.7.4 herein.

3.7.4 Microcircuit die used in the oscillator shall be from NSC/FC 54ACT family and must be from

wafer lot that has been successfully tested in the oscillator proposed herein for ionizing radiation

of up to 100 krads.

3.7.5 Lot Traceability: Production lot for these oscillators shall be homogenous. Each element used in

the production lot shall be traceable to a single lot. Swept quartz shall be traceable to the quartz

bar, and its applicable processing details.

Quality Assurance Provisions: The quality assurance provisions shall be per MIL-PRF-55310,

except as specified herein.

100% Screening: The 100% screening shall be performed as per Table II. PDA requirements for

nondestructive bond pull and burn-in shall be as specified below.

PDA for Nondestruct Bond Pull: Unless otherwise specified, PDA shall be 2% of total number of

wires or 1 wire whichever is greater.

PDA for Burn-in: Unless otherwise specified, PDA for burn-in shall be 2% or 1 oscillator whichever

is greater and shall be applicable to +23 C and/or +25 C static tests only. In addition Delta

Calculation shall be performed after Burn-in and shall count for PDA. All measured values for

Delta Calculation shall be recorded. Parts that exceed the specified delta limits shall be rejected and

be counted for PDA. Delta Calculation shall be performed at 5.0 VDC for the following parameters:

Input Current

Output High Level

Output Low Level

10% change Maximum

0.1V change Maximum

4.1

4.2

4.3

4.4

4.5

4.6

Group A inspection shall be in accordance with MIL-PRF-55310 for product level S.

Group B inspection shall be in accordance with MIL-PRF-55310 for product level S.

Parts shall be capable of meeting group C inspection per MIL-PRF-55310. Generic group C

inspection data on similar parts may be used to satisfy this requirement.

Inspection and Test Data: Unless otherwise specified in the purchase order, the following

Inspection and test data documentation shall be supplied with the parts.

Certificate of Conformance

Summary of Class “S” screening Test Results

PDA Calculations for Non-Destruct Bond Pull and Burn-in

Summary of Elements Lot Traceability

Electrical Tests before and after Burn-in

Group A Inspection Summary

Group B (30 day Aging) Data

Radiographic Inspection Certificate

4.7

5.0

Preservation, Packaging and Packing: The oscillators shall be clean, dry and packaged in a

manner to provide adequate protection against electrostatic discharge, corrosion, deterioration

and physical damage during shipment.

FSC NO.

DWG. NO.

REV

XSIS ELECTRONICS, INC.

12620 W. 63

St., Shawnee, KS 66216 USA

57051

SCALE

N/A

XE63S-A00

SHEET

3 OF 6

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