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Tel: (852) 8106 7033
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LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
Capacitance and Capacitance Tolerance
Different circuit needs different capacitance and capacitance tolerance. So the selection of capacitance is depended on the need of
customers.
■
Dielectric Material Type of Capacitor
-NPO : The capacitor of this kind dielectric material is considered as ClassⅠcapacitor, including general capacitor and high frequency
NPO capacitor. The electrical properties of NPO capacitor are the most stable one and have little change with temperature, voltage and
time. They are suited for applications where low-losses and high-stability are required, such as filters, oscillators, and timing circuits.
- X7R, X5R : X7R, X5R material is a kind of material has high dielectric constant. The capacitor made of this kind material is considered
as Class
Ⅱ
capacitor whose capacitance is higher than that of class
Ⅰ.
These capacitors are classified as having a semi-stable temperature
characteristic and used over a wide temperature range, such in these kinds of circuits, DC-blocking, decoupling, bypassing, frequency
discriminating etc.
-Y5V : The capacitor made of this kind of material is the highest dielectric constant of all ceramic capacitors. They are used over a
moderate temperature range in application where high capacitance is required because of its unstable temperature coefficient, but where
moderate losses and capacitance changes can be tolerated. Its capacitance and dissipation factors are sensible to measuring conditions,
such as temperature and voltage, etc.
Temperature Range
NPO/ X7R: -55~125℃
X5R: -55~85℃
Y5V: -30~85℃
Voltage
16, 25, 50, 63 VDC.
Capacitance
0.5pF ~ 10uF
Terminations
Tin / Nickel
Tolerance
±0.1pF , +80 ~ -20%
Packing
Tape and Reel (0402, 0603, 0805, 1206, 1210, 1812, 2220)
Dielectric & Values
NPO X7R Y5V Z5U consult product pages of catalog for cap ranges and voltage rating
1
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Fax: (852) 8106 7099
LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
How To Order
LKT
|
Series
NOTE:
1.
Dimensions
Size Code
LxW (inch)
0402
0.04x0.02
0603
0.06x0.03
0805
0.08x0.05
1206
0.12x0.06
0805
|
1.
N
|
2.
102
|
3.
J
|
4.
500
|
5.
R
|
6
2.
Dielectric Style
Dielectric Code
Dielectric material
N
NPO
B
X7R
X
X5R
F
Y5V
3.
Nominal Capacitance
102
0R5
1R0
224
…
10X10
2
0.5
1.0
22X10
4
…
Unit : pF
Note : First two digits are significant; third digit denotes number of zeros; R = decimal.
4.
Capacitance Tolerance
Code
Tolerance
C
±0.25pF
D
±0.5pF
J
±5.0%
K
±10%
M
±20%
Z
+80%
-20%
5.
Rated Voltage
Express
Method
Actual
Value
160
16V
0
250
25V
0
500
50V
0
6.
Pb
Code
Pb
R
RoHS
2
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LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
Specification and Test Condition:
1. Appearance
Dielectrics
NPO/X7R/X5R/Y5V
2. Dimensions
Dielectrics
NPO/X7R/X5R/Y5V
3. Capacitance
Dielectrics
NPO
Specification
No defects or abnormalities
Testing Condition
Visual inspection
Specification
Within the specified dimensions
Testing Condition
Using calipers on micrometer
Specification
Within the specified tolerance
B:±0.1pF;C:±0.25pF;D:±0.5pF;J: ±5%
Within the specified tolerance
J: ±5%；K: ±10%； M: ±20%
Within the specified tolerance
M: ±20%; Z: +80% ~ -20%
Testing Condition
1.0±0.2Vrms, 1MHz±10%
(C>1000 pF, 1.0±0.2Vrms, 1KHz±10%，)
25℃
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25
℃
,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%
（Cp＞10uF,0.5±0.1Vrms,120±24Hz）
at 25℃, 48hrs after annealing
X7R/X5R
Y5V
4. Dissipation Factor
Dielectrics
NPO
X7R/X5R
Y5V
Specification
Cp<30pF, Q≥400+20Cp;
Cp≥30pF, Q≥1000
V
R
≥25V,
DF
≤2.5%
V
R
=16V, DF
≤3.5%
V
R
≤10V,
DF
≤5.0%
V
R
≥25V,
DF
≤7.0%
(C<1.0μF)
DF
≤9.0%
(C≥1.0μF)
V
R
=16V, DF
≤9.0%
V
R
≤10V,
DF
≤12.5%
Testing Condition
1.0±0.2Vrms,1MHz±10% ,25℃
(Cp>1000pF,1.0±0.2Vrms,1KHz±10%)
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
1.0±0.2Vrms, 1KHz±10%,
(Cp＞10uF,0.5±0.1Vrms,120±24Hz)
at 25℃,48hrs after annealing
5. Insulation Resistance
Dielectrics
NPO/X7R/
X5R/Y5V
6. Dielectric Strength
Dielectrics
NPO /X7R/X5R/Y5V
Specification
More than 10 GΩ or 500Ω·F, whichever is
smaller.
Testing Condition
Rated voltage for 60±5sec, at 25℃
Specification
No defects or abnormalities.
Testing Condition
No failure shall be observed when 300% (NPO);250%
(X7R/ X5R/Y5V)of the rated voltage is applied between
terminations for 1 to 5 seconds, provided the charge
/discharge current is less than 500mA
3
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Tel: (852) 8106 7033
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LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
7. Temperature Coefficient of Capacitance
Dielectrics
Specification
NPO
Temperature coefficient within ±30ppm/℃
Cp drift within ±0.2% or ±0.05pF
Testing Condition
Measure capacitance under follow table list temperature:
STEP
NPO, X7R
X5R
Y5V
1
25 ±2
25 ±2
25 ±2
2
-55±3
-55±3
-30±3
3
25 ±2
25 ±2
25 ±2
4
125±3
85±3
85±3
5
25 ±2
25 ±2
25 ±2
1) NPO
The capacitance drift is calculated by dividing the
differences between the maximum and minimum measured
values in the step 1,3 and 5.
The temperature coefficient is determined using the
Capacitance measured in step 3 as a reference.
2) X7R ,X5R and Y5V
The ranges of capacitance change compared within the
above 25
℃
value over the temperature ranges shall be
within the specified ranges.
X7R/X5R
Capacitance change within ±15%
Y5V
Capacitance change within +22%, -82%
8. Adhesion
Dielectrics
Specification
Testing Condition
The pressurizing force shall be 10N (=1000g*f) and the
duration of application shall be 10±1sec.
hooked
jig
board
NPO
X7R/X5R
Y5V
No removal of the terminations or other
defect shall occur.
r=0.5
hip
cross-section
9. Solderability of Termination
Dielectrics
Specification
NPO
X7R/X5R
Y5V
10. Resistance to leaching
Dielectrics
NPO
X7R/X5R
Y5V
95% min. coverage of both terminal
electrodes and less than 5% have pin holes
or rough spots.
Testing Condition
Solder temperature: 230±5℃
Dipping time: 2±1 seconds.
Completely soak both terminal electrodes in solder
Specification
95% min. coverage of both terminal
electrodes and less than 5% have pin holes
or rough spots.
No remarkable visual damage.
Testing Condition
Solder temperature: 270±5℃
Dipping time: 10±1 seconds.
Completely soak both terminal electrodes in solder
4
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LKT
Low Voltage Multilayer Chip Ceramic
Capacitor
11. Bending
Dielectrics
NPO
Specification
No remarkable visual damage
Cp change
≤
±5% or
≤
0.5 pF
No remarkable visual damage
Cp change
≤
±12.5%
Testing Condition
Solder the capacitor on testing substrate and put it on
testing stand. The middle part of substrate shall
successively be pressurized by pressuring rod at a rated of
about 1.0mm/sec. Until the deflection become means of the
1.0mm.
X7R/X5R
Y5V
No remarkable visual damage
Cp change
≤
±30%
12. Resistance to Soldering Heat
Dielectrics
Specification
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
NPO
whichever is larger.
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Cp change within ±5%
X7R/X5R
DF meets initial standard value.
IR meets initial standard value.
No remarkable visual damage
Cp change within ±20%
Y5V
DF meets initial standard value.
IR meets initial standard value.
13. Temperature Cycle
Dielectrics
Testing Condition
Soldering temperature: 270±5℃
Preheating: 120~150
℃
60sec.
Dipping time: 10±1 seconds.
Measurement to be made after being kept at room
temperature for 24±2 (COG) or 48±4(X7R ,X5R, Y5V)
hours.
Recovery for the following period under the standard
condition after test.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150
℃
for 1hr and let sit
for 48±4hrs at room temperature. Perform the initial
measurement.
Specification
No remarkable visual damage
Cp change within ±2.5% or ±0.25pF,
whichever is larger.
NPO
X7R/X5R
No remarkable visual damage
Cp change within ±7.5%
Testing Condition
To perform 5 cycles of the stated environment:
Step
Temperature
Time
1
Min. operating Temp.+0/-3℃
30min
2
25℃
2~3 min
3
Max. operating Temp.+0/-3℃
30 min
4
25℃
2~3 min
Measurement to be made after being kept at room
temperature for 24±2hrs (COG) or 48±4hrs (X7R, X5R,
Y5V) at room temperature, then measure.
*Initial measurement for high dielectric constant type
Perform a heat treatment at 140~150℃ for 1hr and let sit
for 48±4hrs at room temperature.
Perform the initial measurement.
5
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