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Low Noise, Precision
Operational Amplifier
OP27
FEATURES
Low noise: 80 nV p-p (0.1 Hz to 10 Hz), 3 nV/√Hz
Low drift: 0.2 μV/°C
High speed: 2.8 V/μs slew rate, 8 MHz gain bandwidth
Low V
OS
: 10 μV
Excellent CMRR: 126 dB at VCM of ±11 V
High open-loop gain: 1.8 million
Fits OP07, 5534A sockets
Available in die form
PIN CONFIGURATIONS
BAL
BAL 1
–IN 2
+IN 3
V+
OUT
NC
00317-001
OP27
4V– (CASE)
NC = NO CONNECT
Figure 1. 8-Lead TO-99 (J-Suffix)
GENERAL DESCRIPTION
The OP27 precision operational amplifier combines the low
offset and drift of the
OP07
with both high speed and low noise.
Offsets down to 25 μV and maximum drift of 0.6 μV/°C make
the OP27 ideal for precision instrumentation applications.
Exceptionally low noise, e
n
= 3.5 nV/√Hz, at 10 Hz, a low 1/f
noise corner frequency of 2.7 Hz, and high gain (1.8 million),
allow accurate high-gain amplification of low-level signals.
A gain-bandwidth product of 8 MHz and a 2.8 V/μs slew rate
provide excellent dynamic accuracy in high speed, data-
acquisition systems.
A low input bias current of ±10 nA is achieved by use of a bias
current cancellation circuit. Over the military temperature
range, this circuit typically holds I
B
and I
OS
to ±20 nA
and 15 nA, respectively.
The output stage has good load driving capability. A guaranteed
swing of ±10 V into 600 Ω and low output distortion make the
OP27 an excellent choice for professional audio applications.
(Continued on Page 3)
V
OS
TRIM
1
–IN
2
+IN
3
V–
4
OP27
8
V
OS
TRIM
7
V+
6
OUT
00317-002
5
NC
NC = NO CONNECT
Figure 2. 8-Lead CERDIP – Glass Hermetic Seal (Z-Suffix),
8-Lead PDIP (P-Suffix),
8-Lead SO (S-Suffix)
FUNCTIONAL BLOCK DIAGRAM
V+
R3
Q6
R1
1
1
8
R4
R2
1
C2
Q22
Q21
R23
Q23
R24
Q24
R9
Q20
Q1A
NONINVERTING
INPUT (+)
Q3
INVERTING
INPUT (–)
1
R1
.
V
OS
ADJ.
C1
Q46
Q19
OUTPUT
Q1B
Q2B
Q2A
R5
C3
R12
C4
Q11
Q12
Q27
Q28
Q26
Q45
V–
Figure 3.
Rev. F
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2006 Analog Devices, Inc. All rights reserved.
00317-003
AND R2 ARE PERMANENTLY
ADJUSTED AT WAFER TEST FOR
MINIMUM OFFSET VOLTAGE
OP27
TABLE OF CONTENTS
Features .............................................................................................. 1
General Description ......................................................................... 1
Pin Configurations ........................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 4
Electrical Characteristics............................................................. 4
Typical Electrical Characteristics ............................................... 6
Absolute Maximum Ratings............................................................ 7
Thermal Resistance ...................................................................... 7
ESD Caution.................................................................................. 7
Typical Performance Characteristics ..............................................8
Application Information................................................................ 14
Offset Voltage Adjustment ........................................................ 14
Noise Measurements.................................................................. 14
Unity-Gain Buffer Applications ............................................... 14
Comments On Noise ................................................................. 15
Audio Applications .................................................................... 16
References.................................................................................... 18
Outline Dimensions ....................................................................... 19
Ordering Guide............................................................................... 20
REVISION HISTORY
5/06—Rev. E to Rev. F
Removed References to 745 ..............................................Universal
Updated 741 to AD741 ......................................................Universal
Changes to Ordering Guide .......................................................... 20
12/05—Rev. D to Rev. E
Edits to Figure 2 ................................................................................ 1
9/05—Rev. C to Rev. D
Updated Format..................................................................Universal
Changes to Table 1............................................................................ 4
Removed Die Characteristics Figure ............................................ 5
Removed Wafer Test Limits Table .................................................. 5
Changes to Table 5............................................................................ 7
Changes to Comments on Noise Section .................................... 15
Changes to Ordering Guide .......................................................... 24
1/03—Rev. B to Rev. C
Edits to Pin Connections................................................................. 1
Edits to General Description........................................................... 1
Edits to Die Characteristics............................................................. 5
Edits to Absolute Maximum Ratings ............................................. 7
Updated Outline Dimensions ....................................................... 16
Edits to Figure 8 .............................................................................. 14
Edits to Outline Dimensions......................................................... 16
9/01—Rev. 0 to Rev. A
Edits to Ordering Information ........................................................1
Edits to Pin Connections..................................................................1
Edits to Absolute Maximum Ratings ..............................................2
Edits to Package Type .......................................................................2
Edits to Electrical Characteristics .............................................. 2, 3
Edits to Wafer Test Limits ................................................................4
Deleted Typical Electrical Characteristics......................................4
Edits to Burn-In Circuit Figure .......................................................7
Edits to Application Information ....................................................8
Rev. F | Page 2 of 20
OP27
GENERAL DESCRIPTION
(Continued from Page 1)
PSRR and CMRR exceed 120 dB. These characteristics, coupled
with long-term drift of 0.2 μV/month, allow the circuit designer
to achieve performance levels previously attained only by
discrete designs.
Low cost, high volume production of OP27 is achieved by
using an on-chip Zener zap-trimming network. This reliable
and stable offset trimming scheme has proven its effectiveness
over many years of production history.
The OP27 provides excellent performance in low noise,
high accuracy amplification of low level signals. Applications
include stable integrators, precision summing amplifiers,
precision voltage threshold detectors, comparators, and
professional audio circuits such as tape heads and micro-
phone preamplifiers.
The OP27 is a direct replacement for
OP06, OP07,
and
OP45
amplifiers;
AD741
types can be directly replaced by removing
the nulling potentiometer of the
AD741.
Rev. F | Page 3 of 20
OP27
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
V
S
= ±15 V, T
A
= 25°C, unless otherwise noted.
Table 1.
Parameter
INPUT OFFSET VOLTAGE
1
LONG-TERM V
OS
STABILITY
2, 3
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
INPUT NOISE VOLTAGE
3, 4
INPUT NOISE
Voltage Density
3
INPUT NOISE
Current Density
3
INPUT RESISTANCE
Differential Mode
5
Common Mode
INPUT VOLTAGE RANGE
COMMON-MODE REJECTION RATIO
POWER SUPPLY REJECTION RATIO
LARGE SIGNAL VOLTAGE GAIN
OUTPUT VOLTAGE SWING
SLEW RATE
6
GAIN BANDWIDTH PRODUCT
6
OPEN-LOOP OUTPUT RESISTANCE
POWER CONSUMPTION
OFFSET ADJUSTMENT RANGE
1
2
Symbol
V
OS
V
OS
/Time
I
OS
I
B
e
n p-p
e
n
Conditions
Min
i
n
0.1 Hz to 10 Hz
f
O
= 10 Hz
f
O
= 30 Hz
f
O
= 1000 Hz
f
O
= 10 Hz
f
O
= 30 Hz
f
O
= 1000 Hz
1.3
±11.0
114
1000
800
±12.0
±10.0
1.7
5.0
OP27A/E
Typ
10
0.2
7
±10
0.08
3.5
3.1
3.0
1.7
1.0
0.4
6
3
±12.3
126
1
1800
1500
±13.8
±11.5
2.8
8.0
70
90
±4.0
Max
25
1.0
35
±40
0.18
5.5
4.5
3.8
4.0
2.3
0.6
Min
OP27/G
Typ
30
0.4
12
±15
0.09
3.8
3.3
3.2
1.7
1.0
0.4
4
2
±12.3
120
2
1500
1500
±13.5
±11.5
2.8
8.0
70
100
±4.0
Max
100
2.0
75
±80
0.25
8.0
5.6
4.5
0.6
Unit
μV
μV/M
O
nA
nA
μV p-p
nV/√Hz
nV/√Hz
nV/√Hz
pA/√Hz
pA/√Hz
pA/√Hz
MΩ
GΩ
V
dB
μV/V
V/mV
V/mV
V
V
V/μs
MHz
Ω
mW
mV
R
IN
R
INCM
IVR
CMRR
PSRR
A
VO
V
O
SR
GBW
R
O
P
d
0.7
±11.0
100
10
700
600
±11.5
±10.0
1.7
5.0
140
V
CM
= ±11 V
V
S
= ±4 V to ±18 V
R
L
≥ 2 k Ω, V
O
= ±10 V
R
L
≥ 600 Ω, V
O
= ±10 V
R
L
≥ 2 k Ω
R
L
≥ 600 Ω
R
L
≥ 2 kΩ
V
O
= 0, I
O
= 0
V
O
R
P
= 10 kΩ
20
170
Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
Long-term input offset voltage stability refers to the average trend line of V
OS
vs. time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5 μV. Refer to the Typical Performance Characteristics section.
3
Sample tested.
4
See voltage noise test circuit (Figure 31).
5
Guaranteed by input bias current.
6
Guaranteed by design.
Rev. F | Page 4 of 20
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