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AS29LV400B-70BCC

Description
Flash, 256KX16, 70ns, PBGA48, 6 X 8 MM, 1.20 MM HEIGHT, BGA-48
Categorystorage    storage   
File Size311KB,21 Pages
ManufacturerALSC [Alliance Semiconductor Corporation]
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AS29LV400B-70BCC Overview

Flash, 256KX16, 70ns, PBGA48, 6 X 8 MM, 1.20 MM HEIGHT, BGA-48

AS29LV400B-70BCC Parametric

Parameter NameAttribute value
MakerALSC [Alliance Semiconductor Corporation]
Parts packaging codeBGA
package instruction6 X 8 MM, 1.20 MM HEIGHT, BGA-48
Contacts48
Reach Compliance Codeunknown
ECCN codeEAR99
Maximum access time70 ns
Spare memory width8
startup blockBOTTOM
JESD-30 codeR-PBGA-B48
length8 mm
memory density4194304 bit
Memory IC TypeFLASH
memory width16
Number of functions1
Number of terminals48
word count262144 words
character code256000
Operating modeASYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize256KX16
Package body materialPLASTIC/EPOXY
encapsulated codeTFBGA
Package shapeRECTANGULAR
Package formGRID ARRAY, THIN PROFILE, FINE PITCH
Parallel/SerialPARALLEL
Programming voltage3 V
Certification statusNot Qualified
Maximum seat height1.2 mm
Maximum supply voltage (Vsup)3.6 V
Minimum supply voltage (Vsup)2.7 V
Nominal supply voltage (Vsup)3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formBALL
Terminal pitch0.8 mm
Terminal locationBOTTOM
typeNOR TYPE
width6 mm

AS29LV400B-70BCC Preview

Preliminary Information
July 2001
®
AS29LV400
3V 512K x 8/256K × 16 CMOS Flash EEPROM
Features
• Organization: 512Kx8/256Kx16
• Sector architecture
- One 16K; two 8K; one 32K; and seven 64K byte sectors
- One 8K; two 4K; one 16K; and seven 32K word sectors
- Boot code sector architecture—T (top) or B (bottom)
- Erase any combination of sectors or full chip
• Single 2.7-3.6V power supply for read/write operations
• Sector protection
• High speed 70/80/90/120 ns address access time
• Automated on-chip programming algorithm
- Automatically programs/verifies data at specified address
• Automated on-chip erase algorithm
- Automatically preprograms/erases chip or specified
sectors
• Hardware
RES ET
pin
- Resets internal state machine to read mode
• Low power consumption
- 200 nA typical automatic sleep mode current
- 200 nA typical standby current
- 10 mA typical read current
• JEDEC standard software, packages and pinouts
- 48-pin TSOP
- 44-pin SO; availability TBD
- 48-pin BGA
• Detection of program/erase cycle completion
- DQ7
DATA
polling
- DQ6 toggle bit
- DQ2 toggle bit
- RY/
B Y
output
• Erase suspend/resume
- Supports reading data from or programming data
to a sector not being erased
• Low V
CC
write lock-out below 1.5V
• 10 year data retention at 150C
• 100,000 write/erase cycle endurance
Logic block diagram
RY/
V
CC
V
SS
BY
Sector protect/
erase voltage
switches
Erase voltage
generator
DQ0–DQ15
RESE T
WE
B Y TE
CE
OE
A-1
Program/erase
control
Command
register
Input/output
buffers
Program voltage
generator
Chip enable
Output enable
Logic
STB
Data latch
V
CC
detector
Timer
Address latch
STB
Y decoder
Y gating
X decoder
Cell matrix
A0–A17
Selection guide
29LV400-70
Maximum access time
Maximum chip enable access time
Maximum output enable access time
t
AA
t
CE
t
OE
70
70
30
29LV400-80
80
80
30
29LV400-90
90
90
35
29LV400-120
120
120
50
Unit
ns
ns
ns
7/13/01; V.0.9.8
Alliance Semiconductor
P. 1 of 21
Copyright © Alliance Semiconductor. All rights reserved.
AS29LV400
®
Pin arrangements
RESET
NC
RY/BY
NC
A17
A7
A6
A5
A4
A3
A2
A1
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48-pin TSOP
AS29LV400
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
V
SS
A0
44-pin SO (availability TBD)
BY/RY
NC
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
V
SS
OE
DQ0
DQ8
DQ1
DQ9
DQ2
DQ10
DQ3
DQ11
AS29LV400
CE
DQ0
OE
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
RESET
WE
A8
A9
A10
A11
A12
A13
A14
A15
A16
DQ15/A-1
V
SS
BYTE
A16
BY T E
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
48-ball BGA Ball Assignment
7/13/01; V.0.9.8
Alliance Semiconductor
P. 2 of 21
AS29LV400
®
Functional description
The AS29LV400 is an 4 megabit, 3.0 volt Flash memory organized as 512Kbyte of 8 bits/256Kbytes of 16 bits each. For flexible
Erase and Program capability, the 4 megabits of data is divided into eleven sectors: one 16K, two 8K, one 32K, and seven 64k
byte sectors; or one 8K, two 4K, one 16K, and seven 32K word sectors. The ×8 data appears on DQ0–DQ7; the ×16 data appears
on DQ0–DQ15. The AS29LV400 is offered in JEDEC standard 48-pin TSOP, 44-pin SO and 48-pin BGA. This device is designed
to be programmed and erased with a single 3.0V V
CC
supply. The device can also be reprogrammed in standard EPROM
programmers.
The AS29LV400 offers access times of 70/80/90/120 ns, allowing 0-wait state operation of high speed microprocessors. To
eliminate bus contention the device has separate chip enable
(
CE
)
, write enable
(
WE
)
, and output enable
(
O E
)
controls. Word
mode (×16 output) is selected by B Y T E = high. Byte mode (×8 output) is selected by B Y T E = low.
The AS29LV400 is fully compatible with the JEDEC single power supply Flash standard. The device uses standard microprocessor
write timings to send Write commands to the register. An internal state-machine uses register contents to control the erase and
programming circuitry. Write cycles also internally latch addresses and data needed for the Programming and Erase operations.
Data is read in the same manner as other Flash or EPROM devices. Use the Program command sequence to invoke the on-chip
programming algorithm that automatically times the program pulse widths, and verifies proper cell margin. Use the Erase
command sequence to invoke the automated on-chip erase algorithm that preprograms the sector when it is not already
programmed before executing the erase operation. The Erase command also times the erase pulse widths and verifies the proper
cell margins.
Boot sector architecture enables the system to boot from either the top (AS29LV400T) or the bottom (AS29LV400B) sector.
Sector erase architecture allows specified sectors of memory to be erased and reprogrammed without altering data in other
sectors. A sector typically erases and verifies within 1.0 seconds. Hardware sector protection disables both the Program and the
Erase operations in all, or any combination of the eleven sectors. The device provides true background erase with Erase Suspend,
which puts erase operations on hold to either read data from, or program data to, a sector that is not being erased. The Chip
Erase command will automatically erase all unprotected sectors.
When shipped from the factory, AS29LV400 is fully erased (all bits = 1). The programming operation sets bits to 0. Data is
programmed into the array one byte at a time in any sequence and across sector boundaries. A sector must be erased to change
bits from 0 to 1. Erase returns all bytes in a sector to the erased state (all bits = 1). Each sector is erased individually with no
effect on other sectors.
The device features a single 3.0V power supply operation for Read, Write, and Erase functions. Internally generated and regulated
voltages are provided for the Program and Erase operations. A low V
C C
detector automatically inhibits write operations during
power transtitions. The
RY/
B Y pin, DATA polling of DQ7, or toggle bit (DQ6) may be used to detect the end of the program or
to erase operations. The device automatically resets to the Read mode after the Program or Erase operations are completed. DQ2
indicates which sectors are being erased.
The AS29LV400 resists accidental erasure or spurious programming signals resulting from power transitions. The Control
register architecture permits alteration of memory contents only when successful completion of specific command sequences has
occured. During power up, the device is set to Read mode with all Program/Erase commands disabled if V
CC
is less than V
LKO
(lockout voltage). The command registers are not affected by noise pulses of less than 5 ns on OE
,
CE,
or
W E. To initiate Write
commands, CE and W E must be a logical zero and O E a logical 1.
When the device’s hardware R ESE T pin is driven low, any Program/Erase operation in progress is terminated and the internal
state machine is reset to Read mode. If the R ESE T pin is tied to the system reset circuitry and a system reset occurs during an
automated on-chip Program/Erase algorithm, the operating data in the address locations may become corrupted and require
rewriting. Resetting the device enables the system’s microprocessor to read boot-up firmware from the Flash memory.
The AS29LV400 uses Fowler-Nordheim tunnelling to electrically erase all bits within a sector simultaneously. Bytes are
programmed one at a time using the EPROM programming mechanism of hot electron injection.
7/13/01; V.0.9.8
Alliance Semiconductor
P. 3 of 21
AS29LV400
®
Operating modes
Mode
ID read MFR code
ID read device code
Read
Standby
Output disable
Write
Enable sector protect
Sector unprotect
Temporary sector
unprotect
Verify sector protect
Hardware Reset
CE
L
L
L
H
L
L
L
L
X
L
X
OE
L
L
L
X
H
H
V
ID
V
ID
X
L
L
X
WE
H
H
H
X
H
L
Pulse/L
Pulse/L
X
H
H
X
A0
L
H
A0
X
X
A0
L
L
X
L
L
X
A1
L
L
A1
X
X
A1
H
H
X
H
H
X
A6
L
L
A6
X
X
A6
L
H
X
L
H
X
A9
V
ID
V
ID
A9
X
X
A9
V
ID
V
ID
X
V
ID
V
ID
X
RE SET
H
H
H
H
H
H
H
H
V
ID
H
H
L
DQ
Code
Code
D
OUT
High Z
High Z
D
IN
X
X
X
Code
Code
High Z
Verify sector unprotect
L
L = Low (<V
IL
) = logic 0; H = High (>V
IH
) = logic 1; V
ID
= 10.0 ± 1.0V; X = don’t care.
In ×16 mode, BYTE = V
IH
. In ×8 mode, BYTE = V
IL
with DQ8-DQ14 in high Z and DQ15 = A-1.
Verification of sector protect/unprotect during A9 = V
ID.
Mode definitions
Item
ID MFR code,
device code
Read mode
Description
Selected by A9 = V
ID
(9.5V–10.5V), CE = OE = A1 = A6 = L, enabling outputs.
When A0 is low (V
IL
) the output data = 52h, a unique Mfr. code for Alliance Semiconductor Flash products.
When A0 is high (V
IH
), D
OUT
represents the device code for the AS29LV400.
Selected with CE = OE = L, W E = H. Data is valid in t
ACC
time after addresses are stable, t
CE
after CE is low
and t
OE
after O E is low.
Selected with CE = H. Part is powered down, and I
CC
reduced to <1.0 µA when CE = V
CC
± 0.3V = RES ET.
If activated during an automated on-chip algorithm, the device completes the operation before entering
standby.
Selected with CE
=
W E
= L,
O E
= H
. Accomplish all Flash erasure and programming through the command
register. Contents of command register serve as inputs to the internal state machine. Address latching occurs
on the falling edge of WE or C E, whichever occurs later. Data latching occurs on the rising edge WE or C E,
whichever occurs first. Filters on W E prevent spurious noise events from appearing as write commands.
Hardware protection circuitry implemented with external programming equipment causes the device to
disable program and erase operations for specified sectors. For in-system sector protection, refer to Sector
protect algorithm on page 10.
Disables sector protection for all sectors using external programming equipment. All sectors must be
protected prior to sector unprotection. For in-system sector unprotection, refer to Sector unprotect
algorithm on page 10.
Verifies write protection for sector. Sectors are protected from program/erase operations on commercial
programming equipment. Determine if sector protection exists in a system by writing the ID read command
sequence and reading location XXX02h, where address bits A12–17 select the defined sector addresses. A
logical 1 on DQ0 indicates a protected sector; a logical 0 indicates an unprotected sector.
Standby
Output disable Part remains powered up; but outputs disabled with O E pulled high.
Write
Enable
sector protect
Sector
unprotect
Verify sector
protect/
unprotect
7/13/01; V.0.9.8
Alliance Semiconductor
P. 4 of 21
AS29LV400
®
Item
Temporary
sector
unprotect
RE SE T
Deep
power down
Automatic
sleep mode
Description
Temporarily disables sector protection for in-system data changes to protected sectors. Apply +10V to
RE SE T to activate temporary sector unprotect mode. During temporary sector unprotect mode, program
protected sectors by selecting the appropriate sector address. All protected sectors revert to protected state on
removal of +10V from RE SET.
Resets the interal state machine to read mode. If device is programming or erasing when RESET = L, data
may be corrupted.
Hold RESET low to enter deep power down mode (
<
1 µA). Recovery time to start of first read cycle is 50ns.
Enabled automatically when addresses remain stable for 300ns. Typical current draw is 1 µA. Existing data is
available to the system during this mode. If an address is changed, automatic sleep mode is disabled and new
data is returned within standard access times.
Flexible sector architecture
Bottom boot sector architecture (AS29LV400B)
Sector
0
1
2
3
4
5
6
7
8
9
10
×8
00000h–03FFFh
04000h–05FFFh
06000h–07FFFh
08000h–0FFFFh
10000h–1FFFFh
20000h–2FFFFh
30000h–3FFFFh
40000h–4FFFFh
50000h–5FFFFh
60000h–6FFFFh
70000h–7FFFFh
×16
00000h–01FFFh
02000h–02FFFh
03000h–03FFFh
04000h–07FFFh
08000h–0FFFFh
10000h–17FFFh
18000h–1FFFFh
20000h–27FFFh
28000h–2FFFFh
30000h–37FFFh
38000h–3FFFFh
Size
(Kbytes)
16
8
8
32
64
64
64
64
64
64
64
Top boot sector architecture (AS29LV400T)
×8
00000h–0FFFFh
10000h–1FFFFh
20000h–2FFFFh
30000h–3FFFFh
40000h–4FFFFh
50000h–5FFFFh
60000h–6FFFFh
70000h–77FFFh
78000h–79FFFh
7A000h–7BFFFh
7C000h–7FFFFh
×16
00000h–07FFFh
08000h–0FFFFh
10000h–17FFFh
18000h–1FFFFh
20000h–27FFFh
28000h–2FFFFh
30000h–37FFFh
38000h–3BFFFh
3C000h–3CFFFh
3D000h–3DFFFh
Size
(Kbytes)
64
64
64
64
64
64
64
32
8
8
3E000h–3FFFFh
16
In word mode, there are one 8K word, two 4K word, one 16K word, and seven 32K word sectors. Address range is A17–A-1 if
B Y T E
= V
IL
; address range is
A17–A0 if
B Y T E
= V
IH
.
7/13/01; V.0.9.8
Alliance Semiconductor
P. 5 of 21
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