2SD2137 datasheet, PDF - EEWORLD Datasheet

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2SD2137: DescriptionNPN transistor; CategoryDiscrete semiconductor The transistor; File Size1MB，1 Pages; ManufacturerJCET; Websitehttp://www.cj-elec.com/; Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

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2SD2137 Overview

NPN transistor

Features

Product Name: NPN Transistor

Product model: 2SD2137

Product parameters:

Pcm (maximum dissipated power): 2000mW

Ic (collector current): 3000mA

BVcbo (Collector-Base Breakdown Voltage): 60V

BVceo (Collector-Emitter Breakdown Voltage): 60V

BVebo (emitter-base breakdown voltage): 6V

hFE (current gain): Min: 70, Max: 320

VCE (sat) saturation voltage drop: 1.2V

fT (transition frequency): 30MHz

Package: TO-220-3L

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JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD

TO-220-3L Plastic-Encapsulate Transistors

2SD2137

TRANSISTOR (NPN)

TO-220-3L

FEATURES

High

Forward Current Transfer Ratio

which

Has

Satisfactory Linearity

Low

Collector

Emitter Saturation Voltage

CE(sat)

Allowing

Supply

with the

Radial Taping

1. BASE

2. COLLECTOR

3. EMITTER

MAXIMUM RATINGS(T

=25℃ unless otherwise noted)

Symbol

CBO

CEO

EBO

stg

Parameter

Collector-Base Voltage

Collector-Emitter Voltage

Emitter-Base Voltage

Collector Current -Continuous

Collector Power Dissipation

Junction Temperature

Storage Temperature

Value

150

-55-150

Unit

℃

ELECTRICAL CHARACTERISTICS (T

=25℃ unless otherwise specified)

Parameter

Collector-base breakdown voltage

Collector-emitter breakdown voltage

Emitter-base breakdown voltage

Collector cut-off current

Emitter cut-off current

DC current gain

FE(2)

Collector-emitter saturation voltage

Base-emitter voltage

Transition frequency

Turn-on time

Switch time

Storage time

Fall time

CLASSIFICATION OF

Rank

Range

FE(1)

70-150

120-250

160-320

CE(sat)

stg

=50V,I

=1A, I

=-I

=0.1A

=4V, I

=3A

=3A, I

=375mA

=4V, I

=3A

=5V, I

=0.2A, f=10MHz

0.3

2.5

0.2

1.2

1.8

MHz

μs

Symbol

(BR)CBO

(BR)CEO

(BR)EBO

CBO

EBO

FE(1)

Test

=0.1mA, I

=30mA, I

=0.1mA, I

=60V, I

=6V, I

=4V, I

=1A

conditions

Min

100

320

Typ

Max

Unit

μA

A,Mar,2011

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